Interaction of oxygen vacancies with domain walls and its impact on fatigue in ferroelectric thin films
- Creators
- Xiao, Yu
- Bhattacharya, Kaushik
- Other:
- Lagoudas, Dimitris C.
Abstract
The role of oxygen vacancies in fatigue and dielectric breakdown has been a topic of intense research in ferroelectric perovskites like BaTiO_3. This paper presents a comprehensive model that treats the ferroelectrics as polarizable wide band-gap semiconductors where the oxygen vacancies act as donors. First, a fully coupled nonlinear model is developed with space charges, polarization, electric potential and elastic displacements as variables without making any a priori assumptions on the space charge distribution and the polarization. Second, a Pt/BaTiO_3/Pt structure is considered. Full-field coupled numerical simulations are used to investigate the structure of 180° and 90° domain walls in both perfect and defected crystals. The interactions of oxygen vacancies with domain walls are explored. Numerical results show that there is pronounced charge trapping near 90° domain walls, giving rise to possible domain wall pinning and dielectric breakdown. Third, a simple analytical solution of the potential profile for a metal/ferroelectric semiconductor interface is obtained and the depletion layer width is estimated. These analytical estimates agree with our numerical results and provide a useful tool to discuss the implications of our results.
Additional Information
© 2004 Society of Photo-Optical Instrumentation Engineers. We thank Vivek Shenoy and Wei Zhang for useful discussions. We are also glad to acknowledge the financial support of the US Army Research Office through the MURI grant No. DAAD 19-01-1-0517.Attached Files
Published - 354_1.pdf
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Additional details
- Eprint ID
- 63990
- Resolver ID
- CaltechAUTHORS:20160127-064923846
- Army Research Office (ARO)
- DAAD 19-01-1-0517
- Created
-
2016-01-27Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 5387