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Robust charge transport in DNA double crossover assemblies

Odom, Duncan T. and Dill, Erik A. and Barton, Jacqueline K. (2000) Robust charge transport in DNA double crossover assemblies. Chemistry and Biology, 7 (7). pp. 475-481. ISSN 1074-5521. http://resolver.caltech.edu/CaltechAUTHORS:20160129-080803941

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Abstract

Background: Multiple-stranded DNA assemblies, encoded by sequence, have been constructed in an effort to self-assemble nanodevices of defined molecular architecture. Double-helical DNA has been probed also as a molecular medium for charge transport. Conductivity studies suggest that DNA displays semiconductor properties, whereas biochemical studies have shown that oxidative damage to B-DNA at the 5′-G of a 5′-GG-3′ doublet can occur by charge transport through DNA up to 20 nm from a photo-excited metallointercalator. The possible application of DNA assemblies, in particular double crossover (DX) molecules, in electrical nanodevices prompted the design of a DNA DX assembly with oxidatively sensitive guanine moieties and a tethered rhodium photo-oxidant strategically placed to probe charge transport. Results: DX assemblies support long-range charge transport selectively down the base stack bearing the intercalated photo-oxidant. Despite tight packing, no electron transfer (ET) crossover to the adjacent base stack is observed. Moreover, the base stack of a DX assembly is well-coupled and less susceptible than duplex DNA to stacking perturbations. Introducing a double mismatch along the path for charge transport entirely disrupts long-range ET in duplex DNA, but only marginally decreases it in the analogous stack within DX molecules. Conclusions: The path for charge transport in a DX DNA assembly is determined directly by base stacking. As a result, the two closely packed stacks within this assembly are electronically insulated from one another. Therefore, DX DNA assemblies may serve as robust, insulated conduits for charge transport in nanoscale devices.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/S1074-5521(00)00133-2DOIArticle
http://www.sciencedirect.com/science/article/pii/S1074552100001332PublisherArticle
ORCID:
AuthorORCID
Barton, Jacqueline K.0000-0001-9883-1600
Additional Information:© 2000 Elsevier Science Ltd. Received: 31 March 2000. Revisions requested: 19 April 2000. Revisions received: 25 April 2000. Accepted: 25 April 2000. We are grateful to the National Institutes of Health for financial support. We thank also the NIH for predoctoral fellowship support of D.T.O. and the Caltech SURF program for a summer fellowship to E.A.D.
Funders:
Funding AgencyGrant Number
NIHUNSPECIFIED
Caltech Summer Undergraduate Research Fellowship (SURF)UNSPECIFIED
Subject Keywords:DNA circuitry; DNA double crossovers; DNA electron transfer; Guanine oxidation
Record Number:CaltechAUTHORS:20160129-080803941
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20160129-080803941
Official Citation:Duncan T Odom, Erik A Dill, Jacqueline K Barton, Robust charge transport in DNA double crossover assemblies, Chemistry & Biology, Volume 7, Issue 7, 1 July 2000, Pages 475-481, ISSN 1074-5521, http://dx.doi.org/10.1016/S1074-5521(00)00133-2. (http://www.sciencedirect.com/science/article/pii/S1074552100001332)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:64079
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:29 Jan 2016 17:08
Last Modified:29 Jan 2016 17:08

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