Pelekhov, Denis V. and Selcu, Camelia and Banerjee, Palash and Fong, Kin Chung and Hammel, P. Chris and Bhaskaran, Harish and Schwab, Keith (2005) Light-free magnetic resonance force microscopy for studies of electron spin polarized systems. Journal of Magnetism and Magnetic Materials, 286 . pp. 324-328. ISSN 0304-8853. doi:10.1016/j.jmmm.2004.09.088. https://resolver.caltech.edu/CaltechAUTHORS:20160523-144938529
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Abstract
Magnetic resonance force microscopy is a scanned probe technique capable of three-dimensional magnetic resonance imaging. Its excellent sensitivity opens the possibility for magnetic resonance studies of spin accumulation resulting from the injection of spin polarized currents into a para-magnetic collector. The method is based on mechanical detection of magnetic resonance which requires low noise detection of cantilever displacement; so far, this has been accomplished using optical interferometry. This is undesirable for experiments on doped silicon, where the presence of light is known to enhance spin relaxation rates. We report a non-optical displacement detection scheme based on sensitive microwave capacitive readout.
| Item Type: | Article | |||||||||
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| Additional Information: | © 2004 Elsevier B.V. Available online 4 November 2004. This work was supported by the Army Research Office through Grant DAAD 19-02-1-0310 and the Defense Advanced Research Projects Agency through the MOSAIC program. | |||||||||
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| Subject Keywords: | Magnetic resonance force microscopy; Displacement detection; Capacitive displacement detection; ESR; EPR; Silicon | |||||||||
| DOI: | 10.1016/j.jmmm.2004.09.088 | |||||||||
| Record Number: | CaltechAUTHORS:20160523-144938529 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20160523-144938529 | |||||||||
| Official Citation: | Denis V. Pelekhov, Camelia Selcu, Palash Banerjee, Kin Chung Fong, P. Chris Hammel, Harish Bhaskaran, Keith Schwab, Light-free magnetic resonance force microscopy for studies of electron spin polarized systems, Journal of Magnetism and Magnetic Materials, Volume 286, February 2005, Pages 324-328, ISSN 0304-8853, http://dx.doi.org/10.1016/j.jmmm.2004.09.088. (http://www.sciencedirect.com/science/article/pii/S0304885304009795) | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 67263 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Tony Diaz | |||||||||
| Deposited On: | 23 May 2016 22:29 | |||||||||
| Last Modified: | 11 Nov 2021 00:29 |
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