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Light-free magnetic resonance force microscopy for studies of electron spin polarized systems

Pelekhov, Denis V. and Selcu, Camelia and Banerjee, Palash and Fong, Kin Chung and Hammel, P. Chris and Bhaskaran, Harish and Schwab, Keith (2005) Light-free magnetic resonance force microscopy for studies of electron spin polarized systems. Journal of Magnetism and Magnetic Materials, 286 . pp. 324-328. ISSN 0304-8853. https://resolver.caltech.edu/CaltechAUTHORS:20160523-144938529

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Abstract

Magnetic resonance force microscopy is a scanned probe technique capable of three-dimensional magnetic resonance imaging. Its excellent sensitivity opens the possibility for magnetic resonance studies of spin accumulation resulting from the injection of spin polarized currents into a para-magnetic collector. The method is based on mechanical detection of magnetic resonance which requires low noise detection of cantilever displacement; so far, this has been accomplished using optical interferometry. This is undesirable for experiments on doped silicon, where the presence of light is known to enhance spin relaxation rates. We report a non-optical displacement detection scheme based on sensitive microwave capacitive readout.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.jmmm.2004.09.088DOIArticle
http://www.sciencedirect.com/science/article/pii/S0304885304009795PublisherArticle
ORCID:
AuthorORCID
Banerjee, Palash0000-0003-0401-8155
Schwab, Keith0000-0001-8216-4815
Additional Information:© 2004 Elsevier B.V. Available online 4 November 2004. This work was supported by the Army Research Office through Grant DAAD 19-02-1-0310 and the Defense Advanced Research Projects Agency through the MOSAIC program.
Funders:
Funding AgencyGrant Number
Army Research Office (ARO)DAAD 19-02-1-0310
Defense Advanced Research Projects Agency (DARPA)UNSPECIFIED
Subject Keywords:Magnetic resonance force microscopy; Displacement detection; Capacitive displacement detection; ESR; EPR; Silicon
Record Number:CaltechAUTHORS:20160523-144938529
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20160523-144938529
Official Citation:Denis V. Pelekhov, Camelia Selcu, Palash Banerjee, Kin Chung Fong, P. Chris Hammel, Harish Bhaskaran, Keith Schwab, Light-free magnetic resonance force microscopy for studies of electron spin polarized systems, Journal of Magnetism and Magnetic Materials, Volume 286, February 2005, Pages 324-328, ISSN 0304-8853, http://dx.doi.org/10.1016/j.jmmm.2004.09.088. (http://www.sciencedirect.com/science/article/pii/S0304885304009795)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:67263
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:23 May 2016 22:29
Last Modified:09 Mar 2020 13:18

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