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High-Resolution Optical Line Width Measurements as a Material Characterization Tool

Kunkel, Nathalie and Bartholomew, John and Binet, Laurent and Ikesue, Akio and Goldner, Philippe (2016) High-Resolution Optical Line Width Measurements as a Material Characterization Tool. Journal of Physical Chemistry C, 120 (25). pp. 13725-13731. ISSN 1932-7447. doi:10.1021/acs.jpcc.6b03337.

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We present a case study on Eu^(3+)-doped Y_2O_3 transparent ceramics in which high-resolution laser spectroscopy is used as a material characterization tool. By comparing the results from coherent and incoherent optical spectroscopy with other characterization methods, we show that optical techniques can deliver supplementary information about the local environment of the activator ions in materials. Thus, high-resolution spectroscopy may be of interest for the investigation of a wider range of rare earth doped optical materials beyond materials studied for quantum information technology. The refinement of optical spectroscopy for the study of narrow optical transitions in rare earth ion single crystals has demonstrated that these techniques are extremely sensitive tools for probing the local environment of the rare earth ion. These techniques, such as photon echo experiments, have been important in developing materials for quantum information technology and spectral filtering applications. Here, we apply these techniques to transparent ceramic samples and compare the results with information gained from conventional material characterization techniques. Our present study demonstrates the high sensitivity of laser spectroscopic methods to microstructural strain and the presence of defects. In particular, the sensitivity is sufficient to detect small changes introduced by different thermal treatments in nominally equivalent materials. The results of our work show that it is possible to relate high-resolution optical measurements to defects and microstructural strain.

Item Type:Article
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URLURL TypeDescription Information
Kunkel, Nathalie0000-0002-4541-3461
Bartholomew, John0000-0003-0780-2471
Additional Information:© 2016 American Chemical Society. Received: April 1, 2016; Revised: June 2, 2016; Published: June 7, 2016. N.K. thanks the Deutsche Forschungsgemeinschaft (DFG) for a Postdoctoral Research Fellowship (Project KU 3427/1-1). Financial support by the ANR projects RAMACO (12-BS08-0015-01) and DISCRYS (14-CE26-0037-01), Idex ANR-10-IDEX-0001-02 PSL, and Nano’K project RECTUS is gratefully acknowledged. The authors also thank Charles W. Thiel and Alban Ferrier for fruitful discussions, Bruno Viana and Yumiko Katayama for help with the thermoluminescence measurements, and Patrick Aschehoug for technical support during the luminescence measurements. The authors declare no competing financial interest.
Funding AgencyGrant Number
Deutsche Forschungsgemeinschaft (DFG)KU 3427/1-1
Agence Nationale pour la Recherche (ANR)12-BS08-0015-01
Agence Nationale pour la Recherche (ANR)14-CE26-0037-01
Agence Nationale pour la Recherche (ANR)Idex ANR-10-IDEX-0001-02 PSL
Conseil Régional Ile-de-FranceNano'K
Issue or Number:25
Record Number:CaltechAUTHORS:20160805-072914307
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Official Citation:High-Resolution Optical Line Width Measurements as a Material Characterization Tool Nathalie Kunkel, John Bartholomew, Laurent Binet, Akio Ikesue, and Philippe Goldner The Journal of Physical Chemistry C 2016 120 (25), 13725-13731 DOI: 10.1021/acs.jpcc.6b03337
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:69459
Deposited By: Tony Diaz
Deposited On:05 Aug 2016 17:44
Last Modified:11 Nov 2021 04:14

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