CaltechAUTHORS
  A Caltech Library Service

On identification of parameterized switched linear systems

Yuan, Ye and Nakahira, Yorie and Tomlin, Claire J. (2016) On identification of parameterized switched linear systems. In: Proceedings of the 35th Chinese Control Conference. IEEE , Piscataway, NJ, pp. 2189-2195. ISBN 978-1-5090-0910-7. http://resolver.caltech.edu/CaltechAUTHORS:20160830-072812905

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item: http://resolver.caltech.edu/CaltechAUTHORS:20160830-072812905

Abstract

Motivated by applications in fault/attack detection of engineering systems, we formulate in this paper a parameterized switched linear systems identification problem. First, we show that the identifiability of parameterized switched linear systems is equivalent to the global identifiability of a parameterized linear time-invariant system. We propose a new necessary and sufficient condition to check the identifiability of a parameterized linear time-invariant system. Second, using the prior knowledge that the difference between the nominal system and the perturbed system is small (with only a small number of parameters that have been changed), we formulate the fault localization problem as a sparse linear regression problem. We investigate the performance of the proposed algorithm when there is a finite number of samples, and propose a necessary and sufficient condition to determine the number of samples required to achieve a “close-to-true” solution. Potential applications of this work can be: a) development of a sensor placement strategy as well as a real-time monitoring algorithm for the early detection of faults (e.g., material aging, line tripping) or attacks in power grids; b) understanding the functionality of genes, proteins and metabolites in disease dynamics, which could potentially lead to early disease detection and drug design.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1109/ChiCC.2016.7553692 DOIArticle
http://ieeexplore.ieee.org/document/7553692/PublisherArticle
Additional Information:© 2016 IEEE. This work is supported in part by NSF under CPS:ActionWebs (CNS-0931843) and CPS:FORCES (CNS-1239166), by NASA under grants NNX12AR18A and UCSCMCA-14-022 (UARC), by ONR under grants N00014-12-1-0609, N000141310341 (Embedded Humans MURI), and MIT_5710002646 (SMARTS MURI), and by AFOSR under grants UPenn-FA9550-10-1-0567 (CHASE MURI) and the SURE project. We acknowledge Dr. Jorge Gonçalves, Dr. Yilin Mo, Dr. Keith Glover, Dr. Lennart Ljung, Dr. John C. Doyle, and Mr. Roel Dobbe with their great supports.
Funders:
Funding AgencyGrant Number
NSFCNS-0931843
NSFCNS-1239166
NASANNX12AR18A
University Affiliated Research Center (UARC)UCSCMCA-14-022
Office of Naval Research (ONR)N00014-12-1-0609
Office of Naval Research (ONR)N000141310341
Office of Naval Research (ONR)MIT_5710002646
Air Force Office of Scientific Research (AFOSR)FA9550-10-1-0567
SURE ProjectUNSPECIFIED
Subject Keywords:System Identification, Fault Detection, Finite-sample guarantee
Record Number:CaltechAUTHORS:20160830-072812905
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20160830-072812905
Official Citation:Y. Yuan, Y. Nakahira and C. J. Tomlin, "On identification of parameterized switched linear systems," 2016 35th Chinese Control Conference (CCC), Chengdu, China, 2016, pp. 2189-2195. doi: 10.1109/ChiCC.2016.7553692 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7553692&isnumber=7553055
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:70010
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:30 Aug 2016 23:33
Last Modified:30 Aug 2016 23:33

Repository Staff Only: item control page