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Identifying and Quantifying Mineral Abundance through VSWIR Microimaging Spectroscopy: A Comparison to XRD and SEM

Leask, Ellen K. and Ehlmann, Bethany L. (2016) Identifying and Quantifying Mineral Abundance through VSWIR Microimaging Spectroscopy: A Comparison to XRD and SEM. In: 2016 8th Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS). IEEE , Piscataway, NJ, pp. 1-5. ISBN 9781538605905. http://resolver.caltech.edu/CaltechAUTHORS:20160902-093920758

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Abstract

Visible-shortwave infrared microimaging reflectance spectroscopy is a new technique to identify minerals, quantify abundances, and assess textural relationships at sub-millimetre scale without destructive sample preparation. Here we used a prototype instrument to image serpentinized igneous rocks and carbonate-rich travertine deposits to evaluate performance, relative to traditional techniques: XRD (mineralogical analysis of bulk powders with no texture preservation) and SEM/EDS (analysis of phases and textures using chemical data from polished thin sections). VSWIR microimaging spectroscopy is ideal for identifying spatially coherent rare phases, below XRD detection limits. The progress of alteration can also be inferred from spectral parameters and may correspond to phases that are amorphous in XRD. However, VSWIR microimaging spectroscopy can sometimes be challenging with analyses of very dark materials (reflectance <0.05) and mineral mixtures occurring at a spatial scales multiple factors below the pixel size. Abundances derived from linear unmixing typically agree with those from XRD and EDS within ~10%.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/WHISPERS.2016.8071774DOIArticle
http://ieeexplore.ieee.org/document/8071774PublisherArticle
http://www.ieee-whispers.comOrganizationConference Website
https://doi.org/10.22002/D1.222Related ItemResearch Data
ORCID:
AuthorORCID
Ehlmann, Bethany L.0000-0002-2745-3240
Additional Information:© 2016 IEEE. Thanks to A. Fraeman, C. Sanders, and B. Van Gorp for assistance with sample data acquisition and to the entire JPL UCIS team. This work was partially supported by a NASA Mars Fundamental Research Program grant (#NNX12AB42G) to B.L.E., a JPL-RTD/PDF to B.L.E. and D. Blaney, and a private grant to Caltech from the Rose Hills Foundation.
Funders:
Funding AgencyGrant Number
NASANNX12AB42G
JPL Research and Technology Development FundUNSPECIFIED
Rose Hills FoundationUNSPECIFIED
Subject Keywords:Imaging spectroscopy, quantitative mineralogy, Mars analogue, petrology, planetary instruments
Record Number:CaltechAUTHORS:20160902-093920758
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20160902-093920758
Official Citation:E. K. Leask and B. L. Ehlmann, "Identifying and quantifying mineral abundance through VSWIR microimaging spectroscopy: A comparison to XRD and SEM," 2016 8th Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS), Los Angeles, CA, 2016, pp. 1-5. doi: 10.1109/WHISPERS.2016.8071774. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8071774&isnumber=8071655
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:70145
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:02 Sep 2016 18:49
Last Modified:27 Nov 2017 19:30

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