Giuliano, C. R. and Marburger, J. H. and Yariv, A. (1972) Enhancement of self-focusing threshold in sapphire with elliptical beams. Applied Physics Letters, 21 (2). pp. 58-60. ISSN 0003-6951. doi:10.1063/1.1654278. https://resolver.caltech.edu/CaltechAUTHORS:GIUapl72
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Abstract
The power threshold for optically induced bulk damage in sapphire is a sensitive function of the ellipticity of the incident beam shape. Experimental results are consistent with a simple self-focusing theory.
| Item Type: | Article | ||||||
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| Additional Information: | ©1972 The American Institute of Physics. Received 30 March 1972. The authors are grateful to V. Evtuhov for helpful discussions and for providing English translations of Ref. 2 and 3. Work supported in part by the Advanced Research Projects Agency under ARPA Order No. 1434 with Air Force Cambridge Research Laboratories. | ||||||
| Issue or Number: | 2 | ||||||
| DOI: | 10.1063/1.1654278 | ||||||
| Record Number: | CaltechAUTHORS:GIUapl72 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:GIUapl72 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 7076 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Tony Diaz | ||||||
| Deposited On: | 08 Jan 2007 | ||||||
| Last Modified: | 08 Nov 2021 20:39 |
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