Choi, Y. and Eng, P. and Stubbs, J. and Sutton, S. R. and Schmeling, M. and Veryovkin, I. V. and Burnett, D. (2016) Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing. Chemical Geology, 441 . pp. 246-255. ISSN 0009-2541. doi:10.1016/j.chemgeo.2016.08.025. https://resolver.caltech.edu/CaltechAUTHORS:20161020-075848529
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Abstract
X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS) Genesis collector (60326). An internal reference standardization method was developed based on fluorescence from Si and Al in the collector materials. Measured Fe fluence agreed well with that measured previously by us on a sapphire collector (50722) as well as SIMS results by Jurewicz et al. Measured Ni fluence was higher than expected by a factor of two; neither instrumental errors nor solar wind fractionation effects are considered significant perturbations to this value. Impurity Ni within the epitaxial Si layer, if present, could explain the high Ni fluences and therefore needs further investigation. As they stand, these results are consistent with minor temporally-variable Fe and Ni fractionation on the timescale of a year.
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| Additional Information: | © 2016 Elsevier B.V. Received 23 May 2016; Received in revised form 9 August 2016; Accepted 19 August 2016; Available online 21 August 2016. The contributions of Kathy Kitts (the PI on the NASA grants supporting this project) are particularly acknowledged. Dr. Kitts was involved in identifying appropriate samples for this work, collecting XSW data and reporting the initial results. The curatorial staff at Johnson Space Center is thanked for providing the flown samples and the Genesis team for providing the implant standards. The manuscript was improved by the valuable reviews of A. Jurewicz and an anonymous reviewer. This research was supported by NASA Grants DDAP No. NNX07AG02G and SRLIDAP No. NNX07AL96G to Northern Illinois University (K. Kitts, PI), and NASA LARS grants NNX10AH05G to Loyola University Chicago (M. Schmeling, PI) and NNH09AM48I (I. Veryovkin, PI) to Argonne National Laboratory. This work was performed at GeoSoilEnviroCARS (The University of Chicago, Sector 13), Advanced Photon Source (APS), Argonne National Laboratory. GeoSoilEnviroCARS is supported by the National Science Foundation - Earth Sciences (EAR-1128799) and Department of Energy-GeoSciences (DE-FG02-94ER14466). This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. | ||||||||||||||||
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| Subject Keywords: | Solar wind fluence; Genesis mission; X-ray standing wave analysis; Depth profile modeling; Implant quantification | ||||||||||||||||
| DOI: | 10.1016/j.chemgeo.2016.08.025 | ||||||||||||||||
| Record Number: | CaltechAUTHORS:20161020-075848529 | ||||||||||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20161020-075848529 | ||||||||||||||||
| Official Citation: | Y. Choi, P. Eng, J. Stubbs, S.R. Sutton, M. Schmeling, I.V. Veryovkin, D. Burnett, Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing, Chemical Geology, Volume 441, 21 November 2016, Pages 246-255, ISSN 0009-2541, http://dx.doi.org/10.1016/j.chemgeo.2016.08.025. (http://www.sciencedirect.com/science/article/pii/S0009254116304028) | ||||||||||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||||||||||||
| ID Code: | 71307 | ||||||||||||||||
| Collection: | CaltechAUTHORS | ||||||||||||||||
| Deposited By: | Tony Diaz | ||||||||||||||||
| Deposited On: | 20 Oct 2016 20:28 | ||||||||||||||||
| Last Modified: | 11 Nov 2021 04:43 |
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