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Soft error correction for increased densities in VLSI memories

Abdel-Ghaffar, Khaled and McEliece, Robert J. (1984) Soft error correction for increased densities in VLSI memories. ACM SIGARCH Computer Architecture News, 12 (3). pp. 248-250. ISSN 0163-5964. doi:10.1145/773453.808191.

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If VLSI RAM densities are to continue to increase, it will undoubtedly be necessary to take the problems associated with "soft errors" much more seriously than has previously been done. In this paper, we propose a methodology for analyzing the effects of soft errors in VLSI RAMS as feature sizes decrease, and for taking corrective action with error-correcting codes. We will take a parametric approach, making several different assumptions about how the error severity will scale as feature size decreases, and our conclusions will be stated relative to the particular assumption made. It is our hope that as more definite information about VLSI error-scaling becomes available, the results of this paper will prove helpful for designers of ultra-dense memories.

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Additional Information:© 1984 ACM. The research described in this paper was sponsored by the Defense Advanced Research Projects Agency, ARPA order 3771, and monitored by the Office of Naval Research under contract number N00014-79-C-0597.
Funding AgencyGrant Number
Defense Advanced Research Project Agency (DARPA)3771
Office of Naval Research (ONR)N00014-79-C-0597
Issue or Number:3
Record Number:CaltechAUTHORS:20161026-163747495
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Official Citation:Khaled Abdel Ghaffar and Robert J. McEliece. 1984. Soft error correction for increased densities in VLSI memories. SIGARCH Comput. Archit. News 12, 3 (January 1984), 248-250. DOI:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:71517
Deposited By: Kristin Buxton
Deposited On:27 Oct 2016 16:44
Last Modified:11 Nov 2021 04:46

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