Lichterman, Michael Frankston and Richter, Matthias Hermann and Hu, Shu and Crumlin, Ethan J. and Axnanda, S. and Favaro, Marco and Drisdell, Walter and Hussain, Z. and Mayer, Thomas and Brunschwig, Bruce and Lewis, Nathan S. and Liu, Z. and Lewerenz, Hans Joachim (2015) Investigation of the Si/TiO_2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy. ECS Transactions, 66 (6). pp. 97-103. ISSN 1938-6737. doi:10.1149/06606.0097ecst. https://resolver.caltech.edu/CaltechAUTHORS:20161121-082816017
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Abstract
Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces.
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| Additional Information: | © 2015 ECS - The Electrochemical Society. This work was supported through the Office of Science of the U.S. Department of Energy (DOE) under award no. DE-SC0004993 to the Joint Center for Artificial Photosynthesis, a DOE Energy Innovation Hub. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. We thank Dr. Philip Ross for contributions to the conceptual development of the AP-XPS end-station and experimental design. | ||||||||||||||||||||
| Group: | JCAP, Kavli Nanoscience Institute | ||||||||||||||||||||
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| Issue or Number: | 6 | ||||||||||||||||||||
| DOI: | 10.1149/06606.0097ecst | ||||||||||||||||||||
| Record Number: | CaltechAUTHORS:20161121-082816017 | ||||||||||||||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20161121-082816017 | ||||||||||||||||||||
| Official Citation: | Michael Frankston Lichterman, Matthias Hermann Richter, Shu Hu, Ethan J Crumlin, S Axnanda, Marco Favaro, Walter Drisdell, Z Hussain, Thomas Mayer, Bruce Brunschwig, Nathan S. Lewis, Hans Joachim Lewerenz, and Z Liu (Invited) Investigation of the Si/TiO2/Electrolyte Interface Using Operando Tender X-ray Photoelectron Spectroscopy ECS Trans. 2015 66(6): 97-103; doi:10.1149/06606.0097ecst ; Published 15 May 2015 | ||||||||||||||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||||||||||||||||
| ID Code: | 72185 | ||||||||||||||||||||
| Collection: | CaltechAUTHORS | ||||||||||||||||||||
| Deposited By: | Tony Diaz | ||||||||||||||||||||
| Deposited On: | 21 Nov 2016 19:34 | ||||||||||||||||||||
| Last Modified: | 11 Nov 2021 04:57 |
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