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Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy

Richter, Matthias Hermann and Lichterman, Michael Frankston and Hu, Shu and Crumlin, Ethan J. and Mayer, Thomas and Axnanda, S. and Favaro, Marco and Drisdell, Walter and Hussain, Z. and Brunschwig, Bruce and Lewis, Nathan S. and Liu, Z. and Lewerenz, Hans Joachim (2015) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy. ECS Transactions, 66 (6). pp. 105-113. ISSN 1938-6737. http://resolver.caltech.edu/CaltechAUTHORS:20161121-083409878

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Abstract

The energy-band relations and electronic properties for the light absorber/protection-layer stack of TiO_2-stabilized Si photoanodes have been determined by ambient pressure x-ray synchrotron radiation photoelectron spectroscopy under an applied potential (operando), from single core-level emission lines. The experiments have also been complemented with laboratory-based monochromatic XPS data. Electrochemical parameters are additionally derived directly from x-ray photoemission data, and a method is presented to derive interface-state densities from such operando data.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1149/06606.0105ecstDOIArticle
http://ecst.ecsdl.org/content/66/6/105PublisherArticle
ORCID:
AuthorORCID
Lichterman, Michael Frankston0000-0002-0710-7068
Crumlin, Ethan J.0000-0003-3132-190X
Brunschwig, Bruce0000-0002-6135-6727
Lewis, Nathan S.0000-0001-5245-0538
Additional Information:© 2015 ECS - The Electrochemical Society. This work was supported through the Office of Science of the U.S. Department of Energy (DOE) under award no. DE SC0004993 to the Joint Center for Artificial Photosynthesis, a DOE Energy Innovation Hub. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE AC02 05CH11231. We acknowledge Dr. Philip Ross for contributions to the conceptual development of the AP-PES end station and experimental design. We acknowledge Fadl Saadi, Beomgyun Jeong, and Sana Rani for assistance during data collection at the beamline, Ravishankar Sundararaman for helpful discussions and assistance with theory, and Joseph A. Beardslee for assistance in XPS data collection.
Group:JCAP, Kavli Nanoscience Institute
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)DE-SC0004993
Department of Energy (DOE)DE-AC02-05CH11231
Record Number:CaltechAUTHORS:20161121-083409878
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20161121-083409878
Official Citation:Matthias Hermann Richter, Michael Frankston Lichterman, Shu Hu, Ethan J Crumlin, Thomas Mayer, S Axnanda, Marco Favaro, Walter Drisdell, Z Hussain, Bruce Brunschwig, Nathan S. Lewis, Z Liu, and Hans Joachim Lewerenz (Invited) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy ECS Trans. 2015 66(6): 105-113; doi:10.1149/06606.0105ecst ; Published 15 May 2015
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:72186
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:21 Nov 2016 19:32
Last Modified:24 Apr 2019 15:17

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