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Surface quality and surface waves on subwavelength-structured silver films

Gay, G. and Alloschery, O. and Weiner, J. and Lezec, H. J. and O'Dwyer, C. and Sukharev, M. and Seideman, T. (2007) Surface quality and surface waves on subwavelength-structured silver films. Physical Review E, 75 (1). Art. No. 016612. ISSN 1539-3755.

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We analyze the physical-chemical surface properties of single-slit, single-groove subwavelength-structured silver films with high-resolution transmission electron microscopy and calculate exact solutions to Maxwell's equations corresponding to recent far-field interferometry experiments using these structures. Contrary to a recent suggestion the surface analysis shows that the silver films are free of detectable contaminants. The finite-difference time-domain calculations, in excellent agreement with experiment, show a rapid fringe amplitude decrease in the near zone (slit-groove distance out to 3–4 wavelengths). Extrapolation to slit-groove distances beyond the near zone shows that the surface wave evolves to the expected bound surface plasmon polariton (SPP). Fourier analysis of these results indicates the presence of a distribution of transient, evanescent modes around the SPP that dephase and dissipate as the surface wave evolves from the near to the far zone.

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Additional Information:©2007 The American Physical Society. (Received 25 August 2006; published 24 January 2007) Support from the Ministère délégué à l’Enseignement supérieur et à la Recherche under the programme ACI “Nanosciences-Nanotechnologies,” the Région Midi-Pyrénées (Grant No. SFC/CR 02/22), and FASTNet (Grant No. HPRN-CT-2002-00304) EU Research Training Network, is gratefully acknowledged, as is support from the Caltech Kavli Nanoscience Institute, the AFOSR under Plasmon MURI Grant No. FA9550-04-1-0434, the National Energy Research Scientific Computing Center, the U.S. Department of Energy under Contract No. DE-AC03-76SF00098, and the San Diego Supercomputer Center under Grant No. PHY050001. Discussions with P. Lalanne, M. Mansuripur, and H. Atwater and computational assistance from Y. Xie are also gratefully acknowledged.
Group:Kavli Nanoscience Institute
Subject Keywords:silver; metallic thin films; transmission electron microscopy; finite difference time-domain analysis; polaritons; Fourier analysis
Issue or Number:1
Record Number:CaltechAUTHORS:GAYpre07
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:7312
Deposited By: Archive Administrator
Deposited On:29 Jan 2007
Last Modified:02 Oct 2019 23:40

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