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Relationships among Resonant Frequency Changes on a Coated Quartz Crystal Microbalance, Thickness Changes, and Resistance Responses of Polymer−Carbon Black Composite Chemiresistors

Severin, Erik J. and Lewis, Nathan S. (2000) Relationships among Resonant Frequency Changes on a Coated Quartz Crystal Microbalance, Thickness Changes, and Resistance Responses of Polymer−Carbon Black Composite Chemiresistors. Analytical Chemistry, 72 (9). pp. 2008-2015. ISSN 0003-2700. http://resolver.caltech.edu/CaltechAUTHORS:20170125-070259952

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Abstract

The relationships among frequency changes on a film-coated quartz crystal microbalance, thickness changes, and dc resistance changes have been investigated for carbon black−insulating polymer composite vapor detectors. Quartz crystal microbalance (QCM) measurements and ellipsometry measurements have been performed simultaneously on polymer films that do not contain carbon black filler to relate the QCM frequency change and the ellipsometrically determined thickness change to the analyte concentration in the vapor phase. In addition, quartz crystal microbalance measurements and dc resistance measurements on carbon black composites of these same polymers have been performed simultaneously to relate the QCM frequency change and dc electrical resistance response to the analyte concentration in the vapor phase. The data indicate that the dc resistance change is directly relatable to the thickness change of the polymers and that a variety of analytes that produce a given thickness change produce a constant resistance change for each member of the test set of polymers investigated in this work.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1021/ac991026fDOIArticle
http://pubs.acs.org/doi/full/10.1021/ac991026fPublisherArticle
https://www.ncbi.nlm.nih.gov/pubmed/10815958PubMed CentralArticle
ORCID:
AuthorORCID
Lewis, Nathan S.0000-0001-5245-0538
Additional Information:© 2000 American Chemical Society. Received 7 September 1999. Published online 1 April 2000. Published in print 1 May 2000. This work was supported by the National Aeronautics and Space Administration, the Army Research Office, and the Defense Advanced Research Projects Agency.
Funders:
Funding AgencyGrant Number
NASAUNSPECIFIED
Army Research Office (ARO)UNSPECIFIED
Defense Advanced Research Projects Agency (DARPA)UNSPECIFIED
Record Number:CaltechAUTHORS:20170125-070259952
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20170125-070259952
Official Citation:Relationships among Resonant Frequency Changes on a Coated Quartz Crystal Microbalance, Thickness Changes, and Resistance Responses of Polymer−Carbon Black Composite Chemiresistors Erik J. Severin and Nathan S. Lewis Analytical Chemistry 2000 72 (9), 2008-2015 DOI: 10.1021/ac991026f
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:73688
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:26 Jan 2017 00:11
Last Modified:26 Jan 2017 00:11

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