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Capacity limits and matching properties of lateral flux integrated capacitors

Aparicio, R. and Hajimiri, A. (2001) Capacity limits and matching properties of lateral flux integrated capacitors. In: Custom Integrated Circuits Conference (CICC '01), San Diego, CA, 6-9 May 2001. IEEE , Piscataway, NJ, pp. 365-368. ISBN 0 7803 6591 7.

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Theoretical limits for the capacitance density of lateral flux and quasi-fractal capacitors are calculated. These limits are used to investigate the efficiency of various capacitive structures such as lateral flux and quasi-fractal structures. This study leads to two new capacitor structures with high lateral field efficiency. Simulation and experimental results demonstrate higher capacity and superior matching properties compared to the standard horizontal parallel plate and previously reported lateral-field capacitors.

Item Type:Book Section
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Hajimiri, A.0000-0001-6736-8019
Additional Information:© Copyright 2002 IEEE. Reprinted with permission. The authors acknowledge Conexant Systems, Newport Beach, CA for chip fabrication, and specially thank S. Lloyd, R. Magoon, B. Bhattacharyya, F. In’tveld, J. Yu and R. Hlavac. We would also like to acknowledge D. Ham, H. Hashemi, S. Koudounas, S. Mandegaran and H. Wu of Caltech for helpful discussions.
Subject Keywords:capacitance; capacitors; integrated circuit design; monolithic integrated circuits
Record Number:CaltechAUTHORS:APAcicc01
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:7466
Deposited By: Lindsay Cleary
Deposited On:22 Feb 2007
Last Modified:08 Nov 2021 20:43

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