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An et al. Reply

An, Qi and Reddy, K. Madhav and Xie, Kelvin Y. and Hemker, Kevin J. and Goddard, William A., III (2017) An et al. Reply. Physical Review Letters, 118 (8). Art. No. 089602. ISSN 0031-9007. https://resolver.caltech.edu/CaltechAUTHORS:20170320-141637487

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Abstract

Our Letter reported high-resolution transmission electron microscopy on commercial quality boron showing that ∼2=3 of the grains exhibit smooth microstructure, leading to an x-ray diffraction pattern of well-known beta boron [1]. The other 1=3 grains exhibit a uniform zigzag pattern that extends across the entire grain and exhibits a very regular twinlike symmetry on every other lattice plane. This second phase gives diffraction patterns that are different from beta.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1103/PhysRevLett.118.089602DOIArticle
http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.118.089602PublisherArticle
ORCID:
AuthorORCID
An, Qi0000-0003-4838-6232
Goddard, William A., III0000-0003-0097-5716
Additional Information:© 2017 American Physical Society. Received 29 December 2016; published 22 February 2017.
Issue or Number:8
Record Number:CaltechAUTHORS:20170320-141637487
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20170320-141637487
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:75249
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:20 Mar 2017 22:29
Last Modified:03 Oct 2019 16:48

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