An, Qi and Reddy, K. Madhav and Xie, Kelvin Y. and Hemker, Kevin J. and Goddard, William A., III (2017) An et al. Reply. Physical Review Letters, 118 (8). Art. No. 089602. ISSN 0031-9007. https://resolver.caltech.edu/CaltechAUTHORS:20170320-141637487
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Abstract
Our Letter reported high-resolution transmission electron microscopy on commercial quality boron showing that ∼2=3 of the grains exhibit smooth microstructure, leading to an x-ray diffraction pattern of well-known beta boron [1]. The other 1=3 grains exhibit a uniform zigzag pattern that extends across the entire grain and exhibits a very regular twinlike symmetry on every other lattice plane. This second phase gives diffraction patterns that are different from beta.
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| Additional Information: | © 2017 American Physical Society. Received 29 December 2016; published 22 February 2017. | |||||||||
| Issue or Number: | 8 | |||||||||
| Record Number: | CaltechAUTHORS:20170320-141637487 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20170320-141637487 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 75249 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Tony Diaz | |||||||||
| Deposited On: | 20 Mar 2017 22:29 | |||||||||
| Last Modified: | 03 Oct 2019 16:48 |
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