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Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces

Lichterman, Michael F. and Richter, Matthias H. and Brunschwig, Bruce S. and Lewis, Nathan S. and Lewerenz, Hans-Joachim (2017) Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces. Journal of Electron Spectroscopy and Related Phenomena, 221 . pp. 99-105. ISSN 0368-2048. https://resolver.caltech.edu/CaltechAUTHORS:20170424-080421711

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Abstract

Tender X-ray operando photoemission spectroscopy has been used to directly analyze the energetics of the double layer at a metal-water interface in a dilute electrolyte having a Debye length of several nanometers. The data are compared to a theoretical evaluation of the potential of the solution near the electrode. Due to its noble nature, Ir was chosen as a working electrode material, and KOH(aq) at varied concentrations and thicknesses constituted the electrolyte. Shifts in peak width and binding energy of the water O 1s core level were analyzed by modeling based on Debye-Hückel approximations. The data are consistent with electrochemical formulations of the double layer that provide a foundation to electrochemistry.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://doi.org/10.1016/j.elspec.2017.03.011DOIArticle
http://www.sciencedirect.com/science/article/pii/S0368204816301736PublisherArticle
ORCID:
AuthorORCID
Lichterman, Michael F.0000-0002-0710-7068
Richter, Matthias H.0000-0003-0091-2045
Brunschwig, Bruce S.0000-0002-6135-6727
Lewis, Nathan S.0000-0001-5245-0538
Lewerenz, Hans-Joachim0000-0001-8433-9471
Additional Information:© 2017 Elsevier B.V. Received 11 November 2016, Revised 19 February 2017, Accepted 17 March 2017, Available online 18 March 2017.
Group:JCAP
Subject Keywords:Electrochemical double layer; Operando XPS; Solid/liquid interface
Record Number:CaltechAUTHORS:20170424-080421711
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20170424-080421711
Official Citation:Michael F. Lichterman, Matthias H. Richter, Bruce S. Brunschwig, Nathan S. Lewis, Hans-Joachim Lewerenz, Operando X-ray photoelectron spectroscopic investigations of the electrochemical double layer at Ir/KOH(aq) interfaces, In Journal of Electron Spectroscopy and Related Phenomena, Volume 221, 2017, Pages 99-105, ISSN 0368-2048, https://doi.org/10.1016/j.elspec.2017.03.011. (http://www.sciencedirect.com/science/article/pii/S0368204816301736)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:76835
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:24 Apr 2017 17:06
Last Modified:08 Oct 2019 21:47

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