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Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution

Shapiro, Ian R. and Solares, Santiago D. and Esplandiu, Maria J. and Wade, Lawrence A. and Goddard, William A., III and Collier, C. Patrick (2004) Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution. Journal of Physical Chemistry B, 108 (36). pp. 13613-13618. ISSN 1520-6106. doi:10.1021/jp047937x.

[img] PDF (Simulated energy−distance and force−distance curves, force-field parameters, effects of thermal vibrations, illustrations of bending and local deformation modes of a 5.4 nm diameter SWNT probe, of lateral slipping of a 2.2 nm diameter SWNT probe, and ...) - Supplemental Material
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We have previously reported that 4−6 nm diameter single-wall carbon nanotube (SWNT) probes used for tapping-mode atomic force microscopy (AFM) can exhibit lateral resolution that is significantly better than the probe diameter when prone nanotubes are imaged on a flat SiO_2 surface. To further investigate this phenomenon, accurate models for use in atomistic molecular dynamics simulations were constructed on the basis of transmission electron microscopy (TEM) and AFM data. Probe−sample interaction potentials were generated by utilization of force fields derived from ab initio quantum mechanics calculations and material bulk and surface properties, and the resulting force curves were integrated numerically with the AFM cantilever equation of motion. The simulations demonstrate that, under the AFM imaging conditions employed, elastic deformations of both the probe and sample nanotubes result in a decrease of the apparent width of the sample. This behavior provides an explanation for the unexpected resolution improvement and illustrates some of the subtleties involved when imaging is performed with SWNT probes in place of conventional silicon probes. However, the generality of this phenomenon for other AFM imaging applications employing SWNT probes remains to be explored.

Item Type:Article
Related URLs:
URLURL TypeDescription Information
Solares, Santiago D.0000-0003-0895-8160
Esplandiu, Maria J.0000-0003-2079-0639
Goddard, William A., III0000-0003-0097-5716
Additional Information:© 2004 American Chemical Society. Received: May 14, 2004. Publication Date (Web): August 17, 2004. We thank Professor Stephen Quake, Dr. Jordan Gerton, and Ms. Yuki Matsuda for essential discussions. I.R.S., M.J.E., and C.P.C. were supported by Caltech startup funds and by Arrowhead Research. S.D.S. and W.A.G. were supported by NSF-NIRT Grant CTS-0103002, and by the Microelectronics Advanced Research Corporation (MARCO) and its Focus Center on Function Engineered NanoArchitectonics (FENA). L.A.W. was supported by the Caltech President's Fund and NASA Contract NAS7-1407.
Funding AgencyGrant Number
Arrowhead ResearchUNSPECIFIED
Microelectronics Advanced Research Corporation (MARCO)UNSPECIFIED
Focus Center on Function Engineered NanoArchitectonics (FENA)UNSPECIFIED
Caltech President’s FundUNSPECIFIED
Issue or Number:36
Record Number:CaltechAUTHORS:20170524-090043354
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Official Citation:Influence of Elastic Deformation on Single-Wall Carbon Nanotube Atomic Force Microscopy Probe Resolution Ian R. Shapiro, Santiago D. Solares, Maria J. Esplandiu, Lawrence A. Wade, William A. Goddard, and C. Patrick Collier The Journal of Physical Chemistry B 2004 108 (36), 13613-13618 DOI: 10.1021/jp047937x
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:77696
Deposited By: Tony Diaz
Deposited On:24 May 2017 17:05
Last Modified:15 Nov 2021 17:33

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