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Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes

Jiang, Jingjing and Huang, Zhuangqun and Xiang, Chengxiang and Poddar, Rakesh and Lewerenz, Hans-Joachim and Papadantonakis, Kimberly M. and Lewis, Nathan and Brunschwig, Bruce (2017) Nanoelectrical and Nanoelectrochemical Imaging of Pt/p-Si and Pt/p+-Si Electrodes. ChemSusChem, 10 (22). pp. 4657-4663. ISSN 1864-5631. https://resolver.caltech.edu/CaltechAUTHORS:20170627-075439064

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Abstract

The interfacial properties of electrolessly deposited Pt nanoparticles (Pt-NP) on p-Si and p+-Si electrodes have been resolved on the nanometer scale using a combination of scanning probe methods. Atomic-force microscopy (AFM) showed highly dispersed Pt nanoparticles. Conductive AFM measurements showed that only about half of the particles exhibited measurable contact currents, with a factor of 10^3 difference in current. Local current-voltage measurements revealed a rectifying junction with a resistance of ≥ 10 MΩ at the Pt-NP/p-Si interface, while Pt-NP/p+-Si samples formed an Ohmic junction with a local resistance of ≥ 1 MΩ. The particles were strongly attached to the sample surface in air. However in contact with an electrolyte, the adhesion of the particles to the surface was substantially lower. Scanning electrochemical microscopy (SECM) showed smaller, but more uniform electrochemical currents for the particles relative to the currents observed in conductive AFM measurements. In accord with the conductive AFM measurements, SECM measurements showed conductance through the substrate for only a minority of the particles. These results suggest that the electrochemical performance of the electrolessly deposited Pt nanoparticles on Si is ascribable to: 1) the high resistance of the contact between the particles and the substrate; 2) the low (<50%) fraction of particles that support high currents; and 3) the low adhesion of the particles to the surface in the electrolyte.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1002/cssc.201700893DOIArticle
http://onlinelibrary.wiley.com/doi/10.1002/cssc.201700893/abstractPublisherArticle
ORCID:
AuthorORCID
Xiang, Chengxiang0000-0002-1698-6754
Lewerenz, Hans-Joachim0000-0001-8433-9471
Papadantonakis, Kimberly M.0000-0002-9900-5500
Lewis, Nathan0000-0001-5245-0538
Brunschwig, Bruce0000-0002-6135-6727
Additional Information:© 2017 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim. Issue online: 23 November 2017; Version of record online: 7 August 2017; Accepted manuscript online: 21 June 2017; Manuscript Revised: 19 June 2017; Manuscript Received: 22 May 2017. Funded by: U.S. Department of Energy. Grant Number: DE-SC0004993; Gordon and Betty Moore Foundation. Grant Number: GBMF1225.
Group:JCAP
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)DE-SC0004993
Gordon and Betty Moore FoundationGBMF1225
Subject Keywords:afm; electrochemistry; energy conversion; interface; secm
Issue or Number:22
Record Number:CaltechAUTHORS:20170627-075439064
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20170627-075439064
Official Citation:J. Jiang, Z. Huang, C. Xiang, R. Poddar, H.-J. Lewerenz, K. M. Papadantonakis, N. S. Lewis, B. S. Brunschwig, ChemSusChem 2017, 10, 4657
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:78588
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:27 Jun 2017 19:49
Last Modified:08 Oct 2019 21:47

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