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X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

Liu, J. P. and Kirchhoff, J. and Zhou, L. and Zhao, M. and Grapes, M. D. and Dale, D. S. and Tate, M. D. and Philipp, H. T. and Gruner, S. M. and Weihs, T. P. and Hufnagel, T. C. (2017) X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating. Journal of Synchrotron Radiation, 24 (4). pp. 796-801. ISSN 1600-5775. https://resolver.caltech.edu/CaltechAUTHORS:20170720-101438771

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Abstract

A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the silicon substrate, monitored by an infrared pyrometer. As an example, reflectivity data from Al/Ni heated at rates up to 200 K s^(−1) are presented. At short times the interdiffusion coefficient can be determined from the rate of decay of the reflectivity peaks, and it is shown that the activation energy for interdiffusion is consistent with a grain boundary diffusion mechanism. At longer times the simple analysis no longer applies because the evolution of the reflectivity pattern is complicated by other processes, such as nucleation and growth of intermetallic phases.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1107/S1600577517008013DOIArticle
http://scripts.iucr.org/cgi-bin/paper?S1600577517008013PublisherArticle
Additional Information:© 2017 International Union of Crystallography. This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. Received 16 December 2016; Accepted 30 May 2017. JK, MZ, LZ, TPW and TCH gratefully acknowledge support for this work from the US Department of Energy under grant No. DE-SC002509. JPL gratefully acknowledges financial support from the Chinese Scholarship Council (CSC). This work is based upon research conducted at the Cornell High Energy Synchrotron Source (CHESS) which is supported by the National Science Foundation and the National Institutes of Health/National Institute of General Medical Sciences under NSF award DMR-1332208. Detector development at Cornell is supported by the DOE Grant No. DE-SC0016035 and CHESS.
Group:JCAP
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)DE-SC002509
Chinese Scholarship CouncilUNSPECIFIED
NSFDMR-1332208
NIHUNSPECIFIED
Department of Energy (DOE)DE-SC0016035
Subject Keywords:X-ray reflectivity; multilayer; interdiffusion
Issue or Number:4
Record Number:CaltechAUTHORS:20170720-101438771
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20170720-101438771
Official Citation:Liu, J. P., Kirchhoff, J., Zhou, L., Zhao, M., Grapes, M. D., Dale, D. S., Tate, M. D., Philipp, H. T., Gruner, S. M., Weihs, T. P. & Hufnagel, T. C. (2017). J. Synchrotron Rad. 24, 796-801
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:79249
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:20 Jul 2017 18:12
Last Modified:03 Oct 2019 18:18

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