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Composite Nanowire-Based Probes for Magnetic Resonance Force Microscopy

Barbic, Mladen and Scherer, Axel (2005) Composite Nanowire-Based Probes for Magnetic Resonance Force Microscopy. Nano Letters, 5 (1). pp. 187-190. ISSN 1530-6984. doi:10.1021/nl048373b.

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We present a nanowire-based methodology for the fabrication of ultrahigh sensitivity and resolution probes for atomic resolution magnetic resonance force microscopy (MRFM). The fabrication technique combines electrochemical deposition of multifunctional metals into nanoporous polycarbonate membranes and chemically selective electroless deposition of optical nanoreflector onto the nanowire. The completed composite nanowire structure contains all the required elements for an ultrahigh sensitivity and resolution MRFM sensor with (a) a magnetic nanowire segment providing atomic resolution magnetic field imaging gradients as well as large force gradients for high sensitivity, (b) a noble metal enhanced nanowire segment providing efficient scattering cross-section from a sub-wavelength source for optical readout of nanowire vibration, and (c) a nonmagnetic/nonplasmonic nanowire segment providing the cantilever structure for mechanical detection of magnetic resonance.

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Additional Information:© 2005 American Chemical Society. Received 1 October 2004. Published online 13 November 2004. Published in print 1 January 2005. This work was supported by the Caltech Grubstake Fund and by the NSF-CAREER award (DMR-0349319). The authors thank Dr. Joyce Wong for helpful suggestions and careful reading of the manuscript.
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Caltech Grubstake FundUNSPECIFIED
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Official Citation:Composite Nanowire-Based Probes for Magnetic Resonance Force Microscopy Mladen Barbic and Axel Scherer Nano Letters 2005 5 (1), 187-190 DOI: 10.1021/nl048373b
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:79558
Deposited By: Ruth Sustaita
Deposited On:28 Jul 2017 23:00
Last Modified:15 Nov 2021 17:48

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