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Transverse modal behavior of transverse junction stripe laser excited by short electrical pulse

Lau, Kam Y. and Yariv, Amnon (1980) Transverse modal behavior of transverse junction stripe laser excited by short electrical pulse. In: 1980 International Electron Devices Meeting. IEEE , Piscataway, NJ, pp. 366-369. https://resolver.caltech.edu/CaltechAUTHORS:20170802-162718858

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Abstract

The transverse modal behavior of the transverse junction stripe (TJS) laser excited by short (70 ps) electrical pulse is investigated experimentally and theoretically, It is predicted theoretically and observed experimentally that the transverse mode strongly depends on the excitation pulse amplitude and the dc bias current (which is set below threshold), This dependence is found to be due to transient lateral carrier diffusion at the lasing junction.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/IEDM.1980.189839DOIArticle
http://ieeexplore.ieee.org/document/1481282/PublisherArticle
https://resolver.caltech.edu/CaltechETD:etd-10042006-111807Related ItemCaltech PhD Thesis
Additional Information:© 1980 IEEE.
DOI:10.1109/IEDM.1980.189839
Record Number:CaltechAUTHORS:20170802-162718858
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20170802-162718858
Official Citation:K. Y. Lau and A. Yariv, "Transverse modal behavior of transverse junction stripe laser excited by short electrical pulse," 1980 International Electron Devices Meeting, 1980, pp. 366-369. doi: 10.1109/IEDM.1980.189839
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:79797
Collection:CaltechAUTHORS
Deposited By: Kristin Buxton
Deposited On:02 Aug 2017 23:36
Last Modified:15 Nov 2021 17:50

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