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Local Electronic Structure of Single-Walled Carbon Nanotubes from Electrostatic Force Microscopy

Heo, Jinseong and Bockrath, Marc (2005) Local Electronic Structure of Single-Walled Carbon Nanotubes from Electrostatic Force Microscopy. Nano Letters, 5 (5). pp. 853-857. ISSN 1530-6984. doi:10.1021/nl0501765. https://resolver.caltech.edu/CaltechAUTHORS:20170807-071415310

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Abstract

An atomic force microscope was used to locally perturb and detect the charge density in carbon nanotubes. Changing the tip voltage varied the Fermi level in the nanotube. The local charge density increased abruptly whenever the Fermi level was swept through a van Hove singularity in the density of states, thereby coupling the cantilever's mechanical oscillations to the nanotube's local electronic properties. By using our technique to measure the local band gap of an intratube quantum-well structure, created by a nonuniform uniaxial strain, we have estimated the nanotube chiral angle. Our technique does not require attached electrodes or a specialized substrate, yielding a unique high-resolution spectroscopic tool that facilitates the comparison between local electronic structure of nanomaterials and further transport, optical, or sensing experiments.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1021/nl0501765DOIArticle
http://pubs.acs.org/doi/abs/10.1021/nl0501765PublisherArticle
Additional Information:© 2005 American Chemical Society. Received 27 January 2005. Published online 29 April 2005. Published in print 1 May 2005. We thank C. N. Lau for helpful discussions. Supported by Arrowhead Research Corporation and the Charles Lee Powell Foundation.
Funders:
Funding AgencyGrant Number
Arrowhead Research CorporationUNSPECIFIED
Charles Lee Powell FoundationUNSPECIFIED
Issue or Number:5
DOI:10.1021/nl0501765
Record Number:CaltechAUTHORS:20170807-071415310
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20170807-071415310
Official Citation:Local Electronic Structure of Single-Walled Carbon Nanotubes from Electrostatic Force Microscopy Jinseong Heo and Marc Bockrath Nano Letters 2005 5 (5), 853-857 DOI: 10.1021/nl0501765
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:79827
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:07 Aug 2017 17:39
Last Modified:15 Nov 2021 17:50

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