Boctor, Waguih J. and Prasad, Sheila (1974) Generation-recombination noise of junction-gate field-effect transistors. Proceedings of the Institution of Electrical Engineers, 121 (12). p. 1457. ISSN 0020-3270. doi:10.1049/piee.1974.0306. https://resolver.caltech.edu/CaltechAUTHORS:20170809-144231919
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Abstract
The generation-recombination noise of junction-gate field-effect transistors is calculated taking into account the variable mobility. The field dependence of mobility suggested by Trofimenkoff is used, and the resultant spectral intensity of the drain-noise fluctuations shows no signs of a logarithmic singularity at saturation. The need for any cutoff procedure to remove the logarithmic singularity at saturation is therefore removed, and it is thus an improvement over earlier methods.
| Item Type: | Article | |||||||||
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| Additional Information: | © 1974 The Institution of Electrical Engineers. Paper 7303 E, first received 25th March and in revised form 28th, August 1974. | |||||||||
| Subject Keywords: | Field-effect transistors, Noise | |||||||||
| Issue or Number: | 12 | |||||||||
| DOI: | 10.1049/piee.1974.0306 | |||||||||
| Record Number: | CaltechAUTHORS:20170809-144231919 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20170809-144231919 | |||||||||
| Official Citation: | Boctor, Waguih J.; Prasad, Sheila: 'Generation-recombination noise of junction-gate field-effect transistors', Proceedings of the Institution of Electrical Engineers, 1974, 121, (12), p. 1457-1459, DOI: 10.1049/piee.1974.0306 IET Digital Library, http://digital-library.theiet.org/content/journals/10.1049/piee.1974.0306 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 80031 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | INVALID USER | |||||||||
| Deposited On: | 09 Aug 2017 22:09 | |||||||||
| Last Modified: | 05 Oct 2022 15:40 |
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