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Scanning electrical mobility spectrometer

Wang, Shih Chen and Flagan, Richard C. (1989) Scanning electrical mobility spectrometer. Journal of Aerosol Science, 20 (8). pp. 1485-1488. ISSN 0021-8502. http://resolver.caltech.edu/CaltechAUTHORS:WANjas89

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Abstract

The measurement of particle size distributions using electrical mobility methods has become the standard method for the characterization of particles smaller than O. 1 μm in diameter since the development of the Electrical Aerosol Analyzer (EAA) and the Differential Mobility Analyzer (DMA) by Whithy, Liu, and their coworkers (1974, 1975, 1975a). These instruments revolutionized aerosol science by making it possible to follow the dynamics of particles that were, prior to these developments, too small to study in detail. Still, these instruments are far from perfect.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/0021-8502(89)90868-9DOIArticle
http://www.sciencedirect.com/science/article/pii/0021850289908689PublisherArticle
ORCID:
AuthorORCID
Flagan, Richard C.0000-0001-5690-770X
Additional Information:© 1989 Elsevier. The authors gratefully acknowledge many discussions with John Seinfeld that assisted in this research. This research has been performed with support from the Coordinating Research Council.
Funders:
Funding AgencyGrant Number
Coordinating Research CouncilUNSPECIFIED
Record Number:CaltechAUTHORS:WANjas89
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:WANjas89
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:8192
Collection:CaltechAUTHORS
Deposited By: Laura Lutz King
Deposited On:03 Mar 2016 23:57
Last Modified:04 Mar 2016 16:51

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