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Probe–Sample Coupling in the Magnetic Resonance Force Microscope

Suter, A. and Pelekhov, D. V. and Roukes, M. L. and Hammel, P. C. (2002) Probe–Sample Coupling in the Magnetic Resonance Force Microscope. Journal of Magnetic Resonance, 154 (2). pp. 210-227. ISSN 1090-7807. https://resolver.caltech.edu/CaltechAUTHORS:20171106-123523819

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Abstract

The magnetic resonance force microscope (MRFM) provides a route to achieving scanned probe magnetic resonance imaging with extremely high spatial resolution. Achieving this capability will require understanding the force exerted on a microscopic magnetic probe by a spatially extended sample over which the probe is scanned. Here we present a detailed analysis of this interaction between probe and sample. We focus on understanding the situation where the micromagnet mounted on the mechanical resonator generates a very inhomogeneous magnetic field and is scanned over a sample with at least one spatial dimension much larger than that of the micromagnet. This situation differs quite significantly from the conditions under which most MRFM experiments have been carried out where the sample is mounted on the mechanical resonator and placed in a rather weak magnetic field gradient. In addition to the concept of a sensitive slice (the spatial region where the magnetic resonance condition is met) it is valuable to map the forces exerted on the probe by spins at various locations; this leads to the concept of the force slice (the region in which spins exert force on the resonator). Results of this analysis, obtained both analytically and numerically, will be qualitatively compared with an initial experimental finding from an EPR-MRFM experiment carried out on DPPH at 4 K.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1006/jmre.2001.2472DOIArticle
http://www.sciencedirect.com/science/article/pii/S1090780701924723PublisherArticle
ORCID:
AuthorORCID
Roukes, M. L.0000-0002-2916-6026
Additional Information:© 2002 Elsevier Science. Received April 30, 2001; revised October 30, 2001. This work was supported by the U.S. Department of Energy through the Office of Basic Energy Sciences and the Los Alamos National Laboratory Directed Research and Development. One of us (A.S.) is grateful for the partial financial support of the Swiss National Science Foundation.
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)UNSPECIFIED
Los Alamos National LaboratoryUNSPECIFIED
Swiss National Science Foundation (SNSF)UNSPECIFIED
Subject Keywords:MRFM, magnetic resonance force microscope; sensitive slice; scanned probe microscopy
Issue or Number:2
Record Number:CaltechAUTHORS:20171106-123523819
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20171106-123523819
Official Citation:A. Suter, D.V. Pelekhov, M.L. Roukes, P.C. Hammel, Probe–Sample Coupling in the Magnetic Resonance Force Microscope, In Journal of Magnetic Resonance, Volume 154, Issue 2, 2002, Pages 210-227, ISSN 1090-7807, https://doi.org/10.1006/jmre.2001.2472. (http://www.sciencedirect.com/science/article/pii/S1090780701924723)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:82980
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:06 Nov 2017 20:56
Last Modified:03 Oct 2019 19:00

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