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Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV

Windt, D. L. and Donguy, S. and Hailey, C. J. and Koglin, J. and Honkimaki, V. and Ziegler, E. and Christensen, F. E. and Harrison, F. A. (2004) Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy. Proceedings of SPIE. No.5168. Society of Photo-Optical Instrumentation Engineers , Bellingham, WA, pp. 35-40. http://resolver.caltech.edu/CaltechAUTHORS:20180109-153135729

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Abstract

We have determined experimentally optical constants for eight thin film materials that can be used in hard X-ray multilayer coatings. Thin film samples of Ni_(.97)V_(.03), Mo, W, Pt, C, B_4C, Si and SiC were deposited by magnetron sputtering onto superpolished optical flats. Optical constants were determined from fits to reflectance-vs-incidence angle measurements made using synchrotron radiation over the energy range E=35-180 keV. We have also measured the X-ray reflectance of a prototype W/SiC multilayer coating over the energy range E=35-100 keV, and we compare the measured reflectance with a calculation using the newly derived optical constants.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1117/12.505886DOIArticle
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5168/1/Optical-constants-for-hard-x-ray-multilayers-over-the-energy/10.1117/12.505886.fullPublisherArticle
ORCID:
AuthorORCID
Christensen, F. E.0000-0001-5679-1946
Harrison, F. A.0000-0003-2992-8024
Additional Information:© 2004 Society of Photo-Optical Instrumentation Engineers (SPIE). This research was sponsored in part by a grant from NASA.
Group:Space Radiation Laboratory
Funders:
Funding AgencyGrant Number
NASAUNSPECIFIED
Record Number:CaltechAUTHORS:20180109-153135729
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20180109-153135729
Official Citation:David L. Windt, Soizik Donguy, Charles J. Hailey, Jason E. Koglin, Veijo Honkimaki, Eric Ziegler, Finn E. Christensen, Fiona A. Harrison, "Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.505886; http://dx.doi.org/10.1117/12.505886
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:84206
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:09 Jan 2018 23:56
Last Modified:09 Jan 2018 23:56

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