Chen, C. M. Hubert and Cook, Walter R. and Harrison, Fiona A. and Lin, Jiao Y. Y. and Mao, Peter H. and Schindler, Stephen M. (2004) Characterization of the HEFT CdZnTe pixel detectors. In: Hard X-Ray and Gamma-Ray Detector Physics V. Proceedings of SPIE. No.5198. Society of Photo-Optical Instrumentation Engineers , Bellingham, WA, pp. 9-18. https://resolver.caltech.edu/CaltechAUTHORS:20180109-153136001
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Abstract
We have developed large format CdZnTe pixel detectors optimized for astrophysical applications. The detectors, designed for the High Energy Focusing Telescope (HEFT) balloon experiment, each consists of an array of 24x44 pixels, on a 498 μm pitch. Each of the anode segments on a CdZnTe sensor is bonded to a custom, low-noise application-specific integrated circuit (ASIC)optimized to achieve low threshold and good energy resolution. We have studied detectors fabricated by two different bonding methods and corresponding anode plane designs---the first detector has a steering electrode grid, and is bonded to the ASIC with indium bumps; the second detector has no grid but a narrower gap between anode contacts, and is bonded to the ASIC with conductive epoxy bumps and gold stud bumps in series. In this paper, we present results from detailed X-ray testing of the HEFT pixel detectors. This includes measurements of the energy resolution for both single-pixel and split-pixel events, and characterization of the effects of charge trapping, electrode biases and temperature on the spectral performance. Detectors from the two bonding methods are contrasted.
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| Additional Information: | © 2004 Society of Photo-Optical Instrumentation Engineers (SPIE). This research was supported by the NASA Space Science "Supporting Research and Technology" (SR&T) programme under Grant Number NAG5-5398. FAH was further supported by a Presidential Early Career Award, Grant Number NAG5-5322. JL was supported by the National Science Foundation under Grant Number DMR-020-4920. We are grateful for their support. We also thank Aleksey E Bolotnikov for sharing his invaluable experiences with CdZnTe detector testing. Jill Burnham, Branislav Kecman and John Klemic have played crucial roles in the fabrication and testing of the detectors. | |||||||||
| Group: | Space Radiation Laboratory | |||||||||
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| Subject Keywords: | CdZnTe radiation detectors, conductive epoxy, flip-chip devices, indium bump-bonding, radiation detector circuits, sample and hold circuits, semiconductor device bonding, X-ray astronomy detectors | |||||||||
| Series Name: | Proceedings of SPIE | |||||||||
| Issue or Number: | 5198 | |||||||||
| Record Number: | CaltechAUTHORS:20180109-153136001 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20180109-153136001 | |||||||||
| Official Citation: | C. M. Hubert Chen, Walter R Cook, Fiona A Harrison, Jiao Y Y Lin, Peter H Mao, Stephen M Schindler, "Characterization of the HEFT CdZnTe pixel detectors", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.506075; http://dx.doi.org/10.1117/12.506075 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 84207 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | George Porter | |||||||||
| Deposited On: | 10 Jan 2018 00:09 | |||||||||
| Last Modified: | 03 Oct 2019 19:15 |
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