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X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT hard x-ray telescopes

Hussain, Ahsen M. and Christensen, Finn E. and Jimenez-Garate, Mario A. and Craig, William W. and Hailey, Charles J. and Decker, Todd R. and Stern, Marcela and Windt, David L. and Mao, Peter H. and Harrison, Fiona A. and Pareschi, Giovanni and Sanchez del Rio, Manuel and Souvorov, Alexei and Freund, Andreas K. and Tucoulou, Remi and Madsen, Anders and Mammen, Christian (1999) X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT hard x-ray telescopes. In: X-Ray Optics, Instruments, and Missions II. Proceedings of SPIE. No.3766. Society of Photo-Optical Instrumentation Engineers , Bellingham, WA, pp. 184-196. ISBN 9780819432520. https://resolver.caltech.edu/CaltechAUTHORS:20180110-155844697

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Abstract

We have performed x-ray specular reflectivity and scattering measurements of thermally slumped glass substrates on x-ray diffractometers utilizing a rotating anode x-ray source at the Danish Space Research Institute (DSRI) and synchrotron radiation at the European Synchrotron Radiation Facility (ESRF) optics Bending Magnet beamline. In addition, we tested depth graded W/Si multilayer-coated slumped glass using x-ray specular reflectivity measurements at 8.048 keV and 28 keV and energy-dispersive measurements in the 20-50 keV rang at a double-axis diffractometer at the Orsted Laboratory, University of Copenhagen. The thermally slumped glass substrates will be used to fabricate the hard x-ray grazing incidence optics for the High-Energy Focusing Telescope. We compared the measurements to the SODART- mirrors from the SRG telescope mission program. The surface scatter measurement of the thermally slumped glass substrates yields Half Power Diameters (HPD's) of single- bounce mirrors of full-illuminated lengths of ~ 40 arcseconds for typical substrates and as low as ~ 10 arcseconds for the best substrates, whereas the SODART mirrors yields HPD's of ~ 80 arcseconds with very little variation. Both free-standing glass substrates and prototype mounted and multilayer-coated optics were tested. The result demonstrate that the surface scatter contribution, plus any contribution from the mounting procedure, to the Half Power Diameter from a telescope using the slumped glass optics will be in the subarcminute range.In addition we measured low surface microroughness, yielding high reflectivity, from the glass substrates, as well as from the depth graded W/Si multilayer-coated glass glass (interfacial width 4.2 Å).


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1117/12.363635DOIArticle
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3766/1/X-ray-scatter-measurements-from-thermally-slumped-thin-glass-substrates/10.1117/12.363635.fullPublisherArticle
ORCID:
AuthorORCID
Christensen, Finn E.0000-0001-5679-1946
Harrison, Fiona A.0000-0003-2992-8024
Additional Information:© 1999 Society of Photo-Optical Instrumentation Engineers (SPIE). The authors wish to thank the European Synchrotron Radiation Facility (ESRF) for the allocated beamtime and the technical support during the experiments, and the continuing support in this project.
Group:Space Radiation Laboratory
Funders:
Funding AgencyGrant Number
European Synchrotron Radiation FacilityUNSPECIFIED
Subject Keywords:X-ray Reflectivity, X-ray Scattering, Synchrotron Radiation, Hard X-ray Telescopes, X-ray Optics, Segmented Optics, Wolter-I Optics, Thermal Slumping, Depth Graded Multilayers
Series Name:Proceedings of SPIE
Issue or Number:3766
Record Number:CaltechAUTHORS:20180110-155844697
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20180110-155844697
Official Citation:Ahsen M. Hussain, Finn Erland Christensen, Mario A. Jimenez-Garate, William W. Craig, Charles J. Hailey, Todd R. Decker, Marcela Stern, David L. Windt, Peter H. Mao, Fiona A. Harrison, Giovanni Pareschi, Manuel Sanchez del Rio, Alexei Souvorov, Andreas K. Freund, Remi Tucoulou, Anders Madsen, Christian B. Mammen, "X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT hard x-ray telescopes", Proc. SPIE 3766, X-Ray Optics, Instruments, and Missions II, (29 September 1999); doi: 10.1117/12.363635; http://dx.doi.org/10.1117/12.363635
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:84236
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:11 Jan 2018 18:08
Last Modified:03 Oct 2019 19:16

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