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Hard x-ray characterization of a HEFT single-reflection prototype

Christensen, Finn E. and Craig, William W. and Hailey, Charles J. and Jimenez-Garate, Mario A. and Windt, David L. and Harrison, Fiona A. and Mao, Peter H. and Ziegler, Eric and Honkimaki, Veijo and S. del Rio, Manuel and Freund, Andreas K. and Ohler, Michael (2000) Hard x-ray characterization of a HEFT single-reflection prototype. In: X-Ray Optics, Instruments, and Missions III. Proceedings of SPIE. No.4012. Society of Photo-Optical Instrumentation Engineers , Bellingham, WA, pp. 626-638. ISBN 9780819436375. https://resolver.caltech.edu/CaltechAUTHORS:20180110-155844989

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Abstract

We have measured the hard X-ray reflectivity and imaging performance from depth graded W/Si multilayer coated mirror segments mounted in a single reflection cylindrical prototype for the hard X-ray telescopes to be flown on the High Energy Focusing Telescope (HEFT) balloon mission. Data have been obtained in the energy range from 18 - 170 keV at the European Synchrotron Radiation Facility and at the Danish Space Research Institute at 8 keV. The modeling of the reflectivity data demonstrate that the multilayer structure can be well described by the intended power law distribution of the bilayer thicknesses optimized for the telescope performance and we find that all the data is consistent with an interfacial width of 4.5 Å. We have also demonstrated that the required 5% uniformity of the coatings is obtained over the mirror surface and we have shown that it is feasible to use similar W/Si coatings for much higher energies than the nominal energy range of HEFT leading the way for designing Gamma-ray telescopes for future astronomical applications. Finally we have demonstrate 35 arcsecond Half Power Diameter imaging performance of the one bounce prototype throughout the energy range of the HEFT telescopes.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1117/12.391602DOIArticle
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4012/1/Hard-x-ray-characterization-of-a-HEFT-single-reflection-prototype/10.1117/12.391602.fullPublisherArticle
ORCID:
AuthorORCID
Christensen, Finn E.0000-0001-5679-1946
Harrison, Fiona A.0000-0003-2992-8024
Additional Information:© 2000 Society of Photo-Optical Instrumentation Engineers (SPIE). We are grateful R. Hustache of the ESRF for expert technical assistance during the measurements.
Group:Space Radiation Laboratory
Subject Keywords:Hard X-ray optics, Multilayers, Synchrotron radiation, High Energy Astrophysics
Series Name:Proceedings of SPIE
Issue or Number:4012
Record Number:CaltechAUTHORS:20180110-155844989
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20180110-155844989
Official Citation:Finn Erland Christensen, William W. Craig, Charles J. Hailey, Mario A. Jimenez-Garate, David L. Windt, Fiona A. Harrison, Peter H. Mao, Eric Ziegler, Veijo Honkimaki, Manuel Sanchez del Rio, Andreas K. Freund, M. Ohler, "Hard x-ray characterization of a HEFT single-reflection prototype", Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391602; http://dx.doi.org/10.1117/12.391602
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:84237
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:11 Jan 2018 16:48
Last Modified:03 Oct 2019 19:16

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