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Slow Scintillation Component and Radiation Induced Readout Noise in Pure CsI Crystals

Yang, Fan and Zhang, Liyuan and Zhu, Ren-Yuan (2016) Slow Scintillation Component and Radiation Induced Readout Noise in Pure CsI Crystals. In: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD). IEEE , Piscataway, NJ, pp. 1-4. ISBN 978-1-5090-1643-3. http://resolver.caltech.edu/CaltechAUTHORS:20180122-090903467

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Abstract

Because of its fast decay time and low cost, pure CsI crystals are used in HEP experiments for fast crystal calorimetry. CsI crystal samples from three vendors were characterized for the Mu2e experiment at Fermilab with data used to define crystal specification. In addition to the fast scintillation component peaked at 310 nm, a slow scintillation component peaked at 450 nm with μs decay time was detected, which may be eliminated spectroscopically by using optical filters. It was also found that the slow scintillation component and the radiation induced readout noise in CsI crystals are highly correlated. The nature of the slow scintillation component is believed to be defects and/or impurity related.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1109/NSSMIC.2016.8069692DOIArticle
http://ieeexplore.ieee.org/document/8069692/AuthorArticle
ORCID:
AuthorORCID
Zhu, Ren-Yuan0000-0003-3091-7461
Additional Information:© 2016 IEEE. Manuscript received December 10, 2016. This work is supported by the U.S. Department of Energy, Office of High Energy Physics program under Award Number DE-SC0011925. Authors are grateful to the Mu2e colleagues in the calorimeter group for the CsI samples discussed in this paper and many useful discussions.
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)DE-SC0011925
Record Number:CaltechAUTHORS:20180122-090903467
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20180122-090903467
Official Citation:F. Yang, L. Zhang and R. Y. Zhu, "Slow scintillation component and radiation induced readout noise in pure CsI crystals," 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, 2016, pp. 1-4. doi: 10.1109/NSSMIC.2016.8069692
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:84442
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:31 Jan 2018 19:15
Last Modified:31 Jan 2018 19:27

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