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Subsystem Fault Tolerance with the Bacon-Shor Code

Aliferis, Panos and Cross, Andrew W. (2007) Subsystem Fault Tolerance with the Bacon-Shor Code. Physical Review Letters, 98 (22). Art. No. 220502. ISSN 0031-9007. http://resolver.caltech.edu/CaltechAUTHORS:ALIprl07

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Abstract

We discuss how the presence of gauge subsystems in the Bacon-Shor code [D. Bacon, Phys. Rev. A 73, 012340 (2006)] leads to remarkably simple and efficient methods for fault-tolerant error correction (FTEC). Most notably, FTEC does not require entangled ancillary states, and it can be implemented with nearest-neighbor two-qubit measurements. By using these methods, we prove a lower bound on the quantum accuracy threshold, 1.94×10^-4 for adversarial stochastic noise, that improves previous lower bounds by nearly an order of magnitude.


Item Type:Article
Additional Information:©2007 The American Physical Society (Received 16 January 2007; published 31 May 2007) We are grateful to Ike Chuang, David DiVincenzo, Debbie Leung, John Preskill, Krysta Svore, and Barbara Terhal for helpful discussions and suggestions. A.C. thanks John Preskill for the invitation to the Caltech Institute for Quantum Information, where some of this work was done. P.A. is supported by the NSF under grant no. PHY-0456720. A.C. is partially supported by IBM T.J. Watson Research Center.
Record Number:CaltechAUTHORS:ALIprl07
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:ALIprl07
Alternative URL:http://dx.doi.org/10.1103/PhysRevLett.98.220502
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:8494
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:15 Aug 2007
Last Modified:18 Sep 2014 18:11

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