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Alignment methods for biased multicanonical sampling

Reimer, Michael and Awadalla, Ahmed and Yevick, David and Lu, Tao (2007) Alignment methods for biased multicanonical sampling. Journal of the Optical Society of America A, 24 (8). pp. 2474-2479. ISSN 1084-7529. http://resolver.caltech.edu/CaltechAUTHORS:REIjosaa07

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Abstract

The efficiency of the multicanonical procedure can be significantly improved by applying an additional bias to the numerically generated sample space. However, results obtained by biasing in different sampling regions cannot in general be accurately combined, since their relative normalization coefficient is not known precisely. We demonstrate that for overlapping biasing regions a simple iterative procedure can be employed to determine the required coefficients.


Item Type:Article
Additional Information:© 2007 Optical Society of America Received January 24, 2007; accepted March 1, 2007; posted March 23, 2007 (Doc. ID 79311); published July 11, 2007 The authors thank the National Sciences and Research Council of Canada, Nortel, the Center for Electrophotonic Materials and Devices (CEMD), and the Ontario Research and Development Challenge Fund (ORDCF) for continued financial support.
Issue or Number:8
Record Number:CaltechAUTHORS:REIjosaa07
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:REIjosaa07
Alternative URL:http://www.opticsinfobase.org/abstract.cfm?URI=josaa-24-8-2474
Official Citation:M. Reimer, A. Awadalla, D. Yevick, and T. Lu, "Alignment methods for biased multicanonical sampling," J. Opt. Soc. Am. A 24, 2474-2479 (2007) http://www.opticsinfobase.org/abstract.cfm?URI=josaa-24-8-2474
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:8506
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:16 Aug 2007
Last Modified:26 Dec 2012 09:39

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