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Extremely broadband ultralight thermally emissive metasurfaces

Naqavi, Ali and Loke, Samuel P. and Kelzenberg, Michael D. and Callahan, Dennis M. and Warmann, Emily C. and Espinet-González, Pilar and Vaidya, Nina and Roy, Tatiana A. and Huang, Jing-Shun and Vinogradova, Tatiana G. and Messer, Alexander J. and Atwater, Harry A. (2017) Extremely broadband ultralight thermally emissive metasurfaces. . (Submitted)

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We report the design, fabrication and characterization of ultralight highly emissive metaphotonic structures with record-low mass/area that emit thermal radiation efficiently over a broad spectral (2 to 35 microns) and angular (0–60°) range. The structures comprise one to three pairs of alternating nanometer-scale metallic and dielectric layers, and have measured effective 300 K hemispherical emissivities of 0.7 to 0.9. To our knowledge, these structures, which are all subwavelength in thickness are the lightest reported metasurfaces with comparable infrared emissivity. The superior optical properties, together with their mechanical flexibility, low outgassing, and low areal mass, suggest that these metasurfaces are candidates for thermal management in applications demanding of ultralight flexible structures, including aerospace applications, ultralight photovoltaics, lightweight flexible electronics, and textiles for thermal insulation.

Item Type:Report or Paper (Discussion Paper)
Related URLs:
URLURL TypeDescription Paper
Kelzenberg, Michael D.0000-0002-6249-2827
Warmann, Emily C.0000-0002-2810-4608
Espinet-González, Pilar0000-0002-7656-0077
Huang, Jing-Shun0000-0002-7531-4691
Atwater, Harry A.0000-0001-9435-0201
Additional Information:Submitted on 9 Oct 2017. We acknowledge financial support from the Northrop Grumman Corporation; E.C.W and H.A.A. were partially supported by the DOE "Light-Material Interactions in Energy Conversion' Energy Frontier Research Center under grant DE-SC0001293. A.N. acknowledges support from the Swiss Science National Foundation. We acknowledge Tom Tiwald of J. A. Woollam Co. for analyzing the ellipsometry measurements of the polyimide layers, and Lynn Rodman of Nexolve for providing materials and guidance in fabricating the thin polyimide layers. We also thank Mark Kruer, George Rossman, Laura Kim, Victoria Chernow, Michelle Sherrot and Will Whitney for assisting with emissivity measurements; Dagny Fleischman, Rebecca Glaudell, Cristofer Flowers and Rebecca Saive for their support during the fabrication and measurements; and Colton Bukowsky and Krishnan Thyagarajan for technical discussions.
Funding AgencyGrant Number
Northrop Grumman CorporationUNSPECIFIED
Department of Energy (DOE)DE-SC0001293
Swiss National Science Foundation (SNSF)UNSPECIFIED
Record Number:CaltechAUTHORS:20180306-092757437
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:85131
Deposited By: Ruth Sustaita
Deposited On:06 Mar 2018 17:45
Last Modified:25 Feb 2020 19:28

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