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Nanoscale doping heterogeneity in few-layer WSe_2 exfoliated onto noble metals revealed by correlated SPM and TERS imaging

Jariwala, Deep and Krayev, Andrey and Wong, Joeson and Robinson, A. Edward and Sherrott, Michelle C. and Wang, Shuo and Liu, Gang-Yu and Terrones, Mauricio and Atwater, Harry A. (2018) Nanoscale doping heterogeneity in few-layer WSe_2 exfoliated onto noble metals revealed by correlated SPM and TERS imaging. 2D Materials, 5 (3). Art. No. 035003. ISSN 2053-1583. doi:10.1088/2053-1583/aab7bc.

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While extensive research effort has been devoted to the study of the 2D semiconductor–insulator interfaces in transition metal dichalcogenides (TMDCs), there is little knowledge about the electronic quality of the semiconductor–metal interface in the atomically thin limit. Here, we present the first correlated nanoscale mapping of the interface of atomically thin WSe_2 with noble metals using co-localized scanning probe microscopy and tip-enhanced optical spectroscopy (TEOS), such as tip-enhanced Raman spectroscopy (TERS). Nanoscale maps of the topography, surface potential, Raman spectra, and the photocurrent amplitude of the WSe_2/metal interfaces reveal striking results. Specifically, correlations between surface potential, resonant Raman signatures and photocurrents that indicate the presence of inhomogeneities within interfacial electronic properties, which we attribute to variations in the local doping of the WSe_2 likely caused by intrinsic compositional fluctuations or defects. Our results suggest that local electrostatic variations at a lateral scale of 10–100 nm are present even in the highest quality of TMDC crystals and must be considered towards understanding of all interfacial phenomena, particularly in device applications that rely on the buried metal–semiconductor junction interface.

Item Type:Article
Related URLs:
URLURL TypeDescription
Jariwala, Deep0000-0002-3570-8768
Wong, Joeson0000-0002-6304-7602
Sherrott, Michelle C.0000-0002-7503-9714
Wang, Shuo0000-0003-2562-0225
Atwater, Harry A.0000-0001-9435-0201
Additional Information:© 2018 IOP Publishing Ltd. Received 6 October 2017; Accepted 19 March 2018; Accepted Manuscript online 19 March 2018; Published 10 April 2018.
Issue or Number:3
Record Number:CaltechAUTHORS:20180410-134442891
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Official Citation:Deep Jariwala et al 2018 2D Mater. 5 035003
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:85730
Deposited By: Tony Diaz
Deposited On:11 Apr 2018 14:43
Last Modified:15 Nov 2021 20:31

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