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Semiconductor Photoelectrochemistry

Anz, Samir J. and Fajardo, Arnel M. and Royea, William J. and Lewis, Nathan S. and Morris, Amanda J. (2002) Semiconductor Photoelectrochemistry. In: Characterization of Materials. Vol.1. Wiley , Hoboken, NJ. ISBN 9780471268826.

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This article discusses methods and experimental protocols in semiconductor electrochemistry. We first discuss the basic principles that govern the energetics and kinetics of charge flow at a semiconductor‐liquid contact. The principal electrochemical techniques of photocurrent and photovoltage measurements used to obtain important interfacial energetic and kinetic quantities of such contacts are then described in detail. After this basic description of concepts and methods in semiconductor electrochemistry, we describe methods for characterizing the optical, electrical, and chemical properties of semiconductors through use of the electrochemical properties of semiconductor‐liquid interfaces.

Item Type:Book Section
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Lewis, Nathan S.0000-0001-5245-0538
Additional Information:© 2003 John Wiley & Sons, Inc. First published: 15 October 2002; Published Online: 12 October 2012.
Subject Keywords:photoconductivity; intensity modulated photocurrent and photovoltage spectroscopy; time‐resolved microwave conductivity; semiconductor‐liquid junctions; laser spot scanning; charge transfer; band gap; electrochemistry
Record Number:CaltechAUTHORS:20180413-100118785
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Official Citation:J. Anz, S. , M. Fajardo, A. , J. Royea, W. , S. Lewis, N. and J. Morris, A. (2012). Semiconductor Photoelectrochemistry. In Characterization of Materials, E. N. Kaufmann (Ed.). doi:10.1002/0471266965.com052.pub2
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:85821
Deposited By: Tony Diaz
Deposited On:13 Apr 2018 17:21
Last Modified:15 Nov 2021 20:32

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