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A novel wide-band noise-parameter measurement method and its cryogenic application

Hu, Robert and Weinreb, Sander (2004) A novel wide-band noise-parameter measurement method and its cryogenic application. IEEE Transactions on Microwave Theory and Techniques, 52 (5). pp. 1498-1507. ISSN 0018-9480. https://resolver.caltech.edu/CaltechAUTHORS:20180604-102042006

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Abstract

The concept of using a long mismatched transmission line to measure noise parameters has been known for some time. However, it has been limited to narrow-bandwidth applications, and a wide-band extension has never been reported. In order to measure the cryogenic noise parameters of a wide-band low-noise amplifier (LNA), a wide-band frequency-variation method is proposed. In this method, the four noise parameters at each frequency are derived numerically from a set of matched and mismatched noise temperatures measured within a surrounding frequency-sampling window. By scanning this frequency-sampling window, noise parameters over a wide frequency range can be obtained. Since this approach can be easily incorporated into existing noise measurement systems, a tuner is not required, and the technique can be applied to a cryogenic amplifier. This paper details the theory, implementation, and verification of this new method. The measured noise parameters of a cryogenic wide-band LNA are presented.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/TMTT.2004.827029DOIArticle
Additional Information:© 2004 IEEE. Manuscript received November 21, 2003; revised January 18, 2004. Author R. Hu thanks Prof. G. Rebeiz, The University of Michigan at Ann Arbor, Dr. M. Edgar, D. Miller, F. Rice, G. Chattopadhyay, J. Kooi, and Prof. J. Zmuidzinas, all of the California Institute of Technology, Pasadena, Dr. J. Ward, Jet Propulsion Laboratory (JPL), Pasadena, CA, and Dr. F. Lo, National Radio Astronomy Observatory (NRAO), Charlottesville, VA, for their support and encouragement.
Subject Keywords:Frequency-variation method, noise-parameter measurement
Issue or Number:5
Record Number:CaltechAUTHORS:20180604-102042006
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20180604-102042006
Official Citation:R. Hu and S. Weinreb, "A novel wide-band noise-parameter measurement method and its cryogenic application," in IEEE Transactions on Microwave Theory and Techniques, vol. 52, no. 5, pp. 1498-1507, May 2004. doi: 10.1109/TMTT.2004.827029
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:86779
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:04 Jun 2018 17:56
Last Modified:03 Oct 2019 19:48

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