Corvasce, C. and Spagnolo, V. and Scamarcio, G. and Lugarà, M. and Adduci, F. and Ferrara, M. and Sibilano, M. and Pellegrino, S. and Del Guidice, M. and Re, M. G. (1995) Quantum-well-laser mirror degradation investigated by microprobe optical spectroscopy. In: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics. Proceedings of SPIE. No.2648. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 360-364. ISBN 0819420212. https://resolver.caltech.edu/CaltechAUTHORS:20180614-161010885
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Abstract
A study of facet degradation of InGaAs quantum well lasers is reported. We tune up a Raman and photoluminescence micro-probe technique for determining the crystal structure and the temperature profile of the cladding layer, in steps of approximately 1 micrometer, with a temperature resolution better than 1 degree Kelvin. The cladding layer composition and cross- section temperature profile have been monitored during operation. A clear correlation between the facet degradation and the type of protective coating is found.
| Item Type: | Book Section | ||||||
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| Additional Information: | © 1995 Society of Photo-Optical Instrumentation Engineers (SPIE). This work has been partially supported by Italian CNR (Research National Council). | ||||||
| Group: | GALCIT | ||||||
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| Subject Keywords: | diode laser, catastrophic optical damage (COD), Raman micro-probe spectroscopy, photoluminescence micro-probe spectroscopy | ||||||
| Series Name: | Proceedings of SPIE | ||||||
| Issue or Number: | 2648 | ||||||
| DOI: | 10.1117/12.226195 | ||||||
| Record Number: | CaltechAUTHORS:20180614-161010885 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20180614-161010885 | ||||||
| Official Citation: | C. Corvasce, Vincenzo Spagnolo, Gaetano Scamarcio, M. Lugara, F. Adduci, Michele Ferrara, Michele Sibilano, Sergio Pellegrino, Massimo del Giudice, M. G. Re, "Quantum-well-laser mirror degradation investigated by microprobe optical spectroscopy", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226195; https://doi.org/10.1117/12.226195 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 87140 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | George Porter | ||||||
| Deposited On: | 15 Jun 2018 15:04 | ||||||
| Last Modified: | 15 Nov 2021 20:45 |
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