CaltechAUTHORS
  A Caltech Library Service

Out-of-Plane Ionic Conductivity Measurement Configuration for High-Throughput Experiments

Huang, Ruiyun and Kucharczyk, Chris J. and Liang, Yangang and Zhang, Xiaohang and Takeuchi, Ichiro and Haile, Sossina M. (2018) Out-of-Plane Ionic Conductivity Measurement Configuration for High-Throughput Experiments. ACS Combinatorial Science, 20 (7). pp. 443-450. ISSN 2156-8952. https://resolver.caltech.edu/CaltechAUTHORS:20180618-081304949

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20180618-081304949

Abstract

An approach for measuring conductivity of thin-film electrolytes in an out-of-plane configuration, amenable to high-throughput experimentation, is presented. A comprehensive analysis of the geometric requirements for success is performed. Using samaria-doped ceria (Ce_(0.8)Sm_(0.2)O_(1.9), SDC) excellent agreement between bulk samples and thin films with continuous and patterned electrodes, 100–500 μm in diameter, is demonstrated. Films were deposited on conductive Nb-doped SrTiO_3, and conductivity was measured by AC impedance spectroscopy over the temperature range from ∼200 to ∼500 °C. The patterned electrode geometry, which encompassed an array of microdot metal electrodes for making top contact, enabled measurements at hundreds of positions on the film, implying the potential for measuring hundreds of composition in a single library.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1021/acscombsci.8b00037DOIArticle
ORCID:
AuthorORCID
Kucharczyk, Chris J.0000-0002-4712-839X
Haile, Sossina M.0000-0002-5293-6252
Additional Information:© 2018 American Chemical Society. Received: March 10, 2018; Revised: May 23, 2018; Published: May 24, 2018. This work was supported by the US National Science Foundation, DMR-1505103, and by the US Department of Energy, through ARPA-e contract DE-AR0000707, via subcontract from Citrine Informatics. Selected facilities used were supported by the National Science Foundation via Northwestern University’s MRSEC, DMR-1121262. Facilities utilized include Northwestern University's Pulsed Laser Deposition facility for film growth, NUFab for microfabrication, and NUANCE for electron microscopy. The authors gratefully acknowledge the assistance provided by Weizi Yuan and Xin Xu in using various experimental procedures. The authors declare no competing financial interest.
Funders:
Funding AgencyGrant Number
NSFDMR-1505103
Department of Energy (DOE)DE-AR0000707
NSFDMR-1121262
Subject Keywords:out-of-plane, high-throughput, ionic conductivity, microdot metal electrodes
Issue or Number:7
Record Number:CaltechAUTHORS:20180618-081304949
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20180618-081304949
Official Citation:Out-of-Plane Ionic Conductivity Measurement Configuration for High-Throughput Experiments. Ruiyun Huang, Chris J. Kucharczyk, Yangang Liang, Xiaohang Zhang, Ichiro Takeuchi, and Sossina M. Haile. ACS Combinatorial Science 2018 20 (7), 443-450. DOI: 10.1021/acscombsci.8b00037
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:87181
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:18 Jun 2018 21:14
Last Modified:03 Oct 2019 19:53

Repository Staff Only: item control page