A Caltech Library Service

Sub-electron noise charge-coupled devices

Chandler, Charles E. and Bredthauer, Richard A. and Janesick, James R. and Westphal, James A. and Gunn, James E. (1990) Sub-electron noise charge-coupled devices. In: Charge-Coupled Devices and Solid State Optical Sensors. Proceedings of SPIE. No.1242. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 238-251. ISBN 0819402893.

[img] PDF - Published Version
See Usage Policy.


Use this Persistent URL to link to this item:


A charge coupled device designed for celestial spectroscopy has achieved readout noise as low as 0.6 electrons rms. A nondestructive output circuit was operated in a special manner to read a single pixel multiple times. Off-chip electronics averaged the multiple values, reducing the random noise by the square root of the number of readouts. Charge capacity was measured to be 500,000 electrons. The device format is 1600 pixels horizontal by 64 pixels vertical. Pixel size is 28 microns square. Two output circuits are located at opposite ends of the 1600 bit CCD register. The device was thinned and operated backside illuminated at -110 degrees C. Output circuit design, layout, and operation are described. Presented data includes the photon transfer curve, noise histograms, and bar-target images down to 3 electrons signal. The test electronics are described, and future improvements are discussed.

Item Type:Book Section
Related URLs:
URLURL TypeDescription
Additional Information:© 1990 Society of Photo-Optical Instrumentation Engineers (SPIE). Project funding was provided by the California Institute of Technology from a grant (AST-8503887) by the National Science Foundation. Credit for successfully performing the wafer fabrication goes to Melanie LaShell.
Funding AgencyGrant Number
Series Name:Proceedings of SPIE
Issue or Number:1242
Record Number:CaltechAUTHORS:20180628-144729737
Persistent URL:
Official Citation:Charles E. Chandler, Richard A. Bredthauer, James R. Janesick, James A. Westphal, "Sub-electron noise charge-coupled devices", Proc. SPIE 1242, Charge-Coupled Devices and Solid State Optical Sensors, (1 July 1990); doi: 10.1117/12.19457;
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:87446
Deposited By: George Porter
Deposited On:29 Jun 2018 15:45
Last Modified:15 Nov 2021 20:48

Repository Staff Only: item control page