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Advanced imaging capabilities by incorporating plasmonics and metamaterials in detectors

Hennessy, John and Jewell, April D. and Hoenk, Michael E. and Hitlin, David and McClish, Mickel and Carver, Alexander G. and Jones, Todd J. and Morsy, Ahmed and Povinelli, Michelle and Bell, L. Douglas and Nikzad, Shouleh (2018) Advanced imaging capabilities by incorporating plasmonics and metamaterials in detectors. In: Micro- and Nanotechnology Sensors, Systems, and Applications X. Proceedings of SPIE. No.10639. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, Art. No. 106391P. ISBN 9781510617896. http://resolver.caltech.edu/CaltechAUTHORS:20180705-162233792

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Abstract

Ultraviolet detection is often required to be made in the presence of a strong background of solar radiation which needs to be suppressed, but materials limitations at these wavelengths can impact both filter and sensor performance. In this work, we explore the use of 1D photonic bandgap structures integrated directly onto a Si sensor that can operate with solar blindness. These filters take advantage of the improved admittance with silicon to significantly improve throughput over conventional stand-alone bandpass filter elements. At far ultraviolet wavelengths these filters require the use of non-absorbing dielectrics such as the metal fluoride materials of MgF_2, AlF_3 and LiF. The latest performance of these 1D multilayer filters on Si photodiodes and CCD imaging sensors is demonstrated. We have also extended these 1D structures to more complex multilayers guided by the design concepts of metamaterials and metatronics, and to 2D patterned plasmonic hole array filters fabricated in aluminum. The performance of sensors and test filter structures is presented with an emphasis on UV throughput.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1117/12.2305126DOIArticle
ORCID:
AuthorORCID
Hitlin, David0000-0003-4028-6982
Additional Information:© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE). The research described in this paper was carried out in part at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration.
Funders:
Funding AgencyGrant Number
NASA/JPL/CaltechUNSPECIFIED
Subject Keywords:ultraviolet, silicon sensor, visible-blind, atomic layer deposition, plasmonics, aluminum
Record Number:CaltechAUTHORS:20180705-162233792
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20180705-162233792
Official Citation:John Hennessy, April D. Jewell, Michael E. Hoenk, David Hitlin, Mickel McClish, Alexander G. Carver, Todd J. Jones, Ahmed Morsy, Michelle Povinelli, L. Douglas Bell, Shouleh Nikzad, "Advanced imaging capabilities by incorporating plasmonics and metamaterials in detectors", Proc. SPIE 10639, Micro- and Nanotechnology Sensors, Systems, and Applications X, 106391P (14 May 2018); doi: 10.1117/12.2305126; https://doi.org/10.1117/12.2305126
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:87577
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:06 Jul 2018 15:46
Last Modified:06 Jul 2018 15:46

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