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Field emission testing of carbon nanotubes for THz frequency vacuum microtube sources

Manohara, Harish and Dang, Wei Lien and Siegel, Peter H. and Hoenk, Michael and Husain, Ali and Scherer, Axel (2003) Field emission testing of carbon nanotubes for THz frequency vacuum microtube sources. In: Reliability, Testing, and Characterization of MEMS/MOEMS III. Proceedings of SPIE. No.5343. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 227-234. ISBN 0819452513.

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A carbon nanotube-based high current density electron field emission source is under development at Jet Propulsion Laboratory (JPL) for submillimeter-wave power generation (300 GHz to 3 THz). This source is the basis for a novel vacuum microtube component: the nanoklystron. The nanoklystron is a monolithically fabricated reflex klystron with dimensions in the micrometer range. The goal is to operate this device at much lower voltages than would be required with hot-electron sources and at much higher frequencies than have ever been demonstrated. Both single-walled (SWNTs) as well as multi-walled nanotubes (MWNTs) are being tested as potential field-emission sources. This paper presents initial results and observations of these field emission tests. SWNTs and MWNTs were fabricated using standard CVD techniques. The tube density was higher in the case of MWNT samples. As previously reported, high-density samples suffered from enhanced screening effect thus decreasing their total electron emission. The highest emission currents were measured from disordered, less dense MWNTs and were found to be ~0.63 mA @ 3.6 V/μm (sample 1) and ~3.55 mA @ 6.25 V/μm (sample 2). The high density vertically aligned MWNTs showed low field emission as predicted: 0.31 mA @ 4.7 V/μm.

Item Type:Book Section
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Siegel, Peter H.0000-0002-2539-4646
Additional Information:© 2003 Society of Photo-Optical Instrumentation Engineers (SPIE). This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with National Aeronautics and Space Administration (NASA). This work was funded by NASA’s Code-R grants and JPL’s Director’s Research and Development Fund. Authors would like to thank Colleen Marrese of JPL and Dr. James Hone of California Institute of Technology (currently at Columbia University) for their initial help.
Funding AgencyGrant Number
JPL Director's Research and Development FundUNSPECIFIED
Subject Keywords:Nanoklystron, Field emission, Nanotubes, THz sources, SWNT, MWNT
Series Name:Proceedings of SPIE
Issue or Number:5343
Record Number:CaltechAUTHORS:20180710-095629084
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Official Citation:Harish Manohara, Wei Lien Dang, Peter H. Siegel, Michael Hoenk, Ali Husain, Axel Scherer, "Field emission testing of carbon nanotubes for THz frequency vacuum microtube sources", Proc. SPIE 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III, (23 December 2003); doi: 10.1117/12.531403;
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:87690
Deposited By: George Porter
Deposited On:10 Jul 2018 17:12
Last Modified:15 Nov 2021 20:50

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