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Trapped Flux and Critical Currents in Superconducting Thin-Film Rings

Mercereau, J. E. and Hunt, T. K. (1962) Trapped Flux and Critical Currents in Superconducting Thin-Film Rings. Physical Review Letters, 8 (6). pp. 243-247. ISSN 0031-9007. doi:10.1103/PhysRevLett.8.243.

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Critical persistent currents have been measured in thin-film tin rings by a mechanical method which utilizes the magnetic moment due to trapped flux in such rings. In addition, this technique yields a measurement of the penetration depth for critical persistent currents in thin films. Currents slightly less than critical have been shown to be truly persistent for periods of more than 10 hours in films whose thickness is less than 5% of the penetration depth. It is found that for tin films less than 700 Å thick, current densities greater than 10^6 amp/cm^2 can be readily achieved within a degree of the transition temperature.

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Additional Information:©1962 The American Physical Society. Received 31 January 1962. Work supported by the National Science Foundation.
Issue or Number:6
Record Number:CaltechAUTHORS:MERprl62
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:8817
Deposited By: Archive Administrator
Deposited On:19 Sep 2007
Last Modified:08 Nov 2021 20:53

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