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X-ray study of W/Si multilayers for the HEFT hard x-ray telescope

Madsen, K. K. and Christensen, F. E. and Jensen, C. P. and Ziegler, E. and Craig, W. W. and Gunderson, K. and Koglin, J. E. and Pedersen, K. (2004) X-ray study of W/Si multilayers for the HEFT hard x-ray telescope. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy. Proceedings of SPIE. No.5168. Society of Photo-optical Instrumentation Engineers , Bellingham, WA, pp. 41-52.

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This paper outlines an in-depth study of the W/Si coated mirrors for the High Energy Focusing Telescope (HEFT). We present data taken at 8, 40 and 60 keV obtained at the Danish Space Research Institute and the European Synchrotron Radiation Facility in Grenoble. The set of samples were chosen to cover the parameter space of sample type, sample size and coating type. The investigation includes a study of the interfacial roughness across the sample surface, as substrates and later as coated, and an analysis of the roughness correlation in the W/Si coatings for N = 10 deposited bilayers. The powerlaw graded flight coating for the HEFT mirrors is studied for uniformity and scatter, as well as its performance at high energies.

Item Type:Book Section
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Madsen, K. K.0000-0003-1252-4891
Christensen, F. E.0000-0001-5679-1946
Additional Information:© 2004 Society of Photo-optical Instrumentation Engineers.
Series Name:Proceedings of SPIE
Issue or Number:5168
Record Number:CaltechAUTHORS:20180925-143612230
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Official Citation:Kristin K. Madsen, Kristin K. Madsen, Finn E. Christensen, Finn E. Christensen, Carsten P. Jensen, Carsten P. Jensen, Eric Ziegler, Eric Ziegler, William W. Craig, William W. Craig, Kurt S. Gunderson, Kurt S. Gunderson, Jason E. Koglin, Jason E. Koglin, K. Pedersen, K. Pedersen, } "X-ray study of W/Si multilayers for the HEFT hard x-ray telescope", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); doi: 10.1117/12.505665;
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:89930
Deposited By: Tony Diaz
Deposited On:25 Sep 2018 21:48
Last Modified:03 Oct 2019 20:20

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