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Differential Colorimetry Measurements of Fluctuation Growth in Nanofilms Exposed to Large Surface Thermal Gradients

Fiedler, Kevin R. and McLeod, Euan and Troian, Sandra M. (2019) Differential Colorimetry Measurements of Fluctuation Growth in Nanofilms Exposed to Large Surface Thermal Gradients. Journal of Applied Physics, 125 (6). Art. No. 065303. ISSN 0021-8979. https://resolver.caltech.edu/CaltechAUTHORS:20181029-102032102

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Abstract

Slender liquid nanofilms exposed to large surface thermal gradients are known to undergo thickness fluctuations, which rapidly self-organize into arrays of nanoprotrusions with a separation distance of tens of microns. We previously reported good agreement between measurements of the characteristic spacing and the wavelength of the most unstable mode predicted by a linear stability analysis based on a long wavelength thermocapillary model. Here, we focus on differential colorimetry measurements to quantify early time out-of-plane growth of protrusions for peak heights spanning 20 to 200 nm. Analysis of peak heights based on shape reconstruction reveals robust exponential growth. Good quantitative agreement of the growth rates with the thermocapillary model is obtained using a single fit constant to account for material parameters of nanofilms that could not be measured directly. These findings lend further support to the conjecture that the array protrusions uncovered almost two decades ago likely stem from a linear instability, whose growth rate is controlled by thermocapillary forces counterbalanced by capillary forces.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1063/1.5051456DOIArticle
https://arxiv.org/abs/1808.04693arXivDiscussion Paper
ORCID:
AuthorORCID
Fiedler, Kevin R.0000-0002-9656-7663
Troian, Sandra M.0000-0003-1224-6377
Additional Information:© 2019 Published under license by AIP Publishing. Submitted: 8 August 2018; Accepted: 24 January 2019; Published Online: 12 February 2019. The authors acknowledge the financial support from the National Science Foundation (NSF) (No. CBET 0701324) and a 2013 NASA Space Technology Research Fellowship to K. R. Fiedler (No. NNX13AN41H). We are also grateful for the use of instrumentation provided by the Molecular Materials Research Center of the Beckman Institute of the California Institute of Technology.
Funders:
Funding AgencyGrant Number
NSFCBET-0701324
NASA Space Technology Research FellowshipNX13AN41H
Issue or Number:6
Record Number:CaltechAUTHORS:20181029-102032102
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20181029-102032102
Official Citation:Differential colorimetry measurements of fluctuation growth in nanofilms exposed to large surface thermal gradients. Kevin R. Fiedler, Euan McLeod, and Sandra M. Troian. Journal of Applied Physics 2019 125:6. doi: 10.1063/1.5051456
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:90463
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:29 Oct 2018 17:28
Last Modified:07 Feb 2020 21:01

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