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Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters

Wang, Lihong and Lin, Shao-Pow and Jacques, Steven L. and Tittel, Frank K. and Harder, Jennifer and Jancarik, John and Mammini, Beth and Small, Ward and Da Silva, Luiz (1995) Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters. In: Optical Biopsies. Proceedings of SPIE. No.2627. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 165-175. ISBN 9780819419910.

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A new, simple and quick approach, oblique-incidence reflectometry, was used to measure the absorption and reduced scattering coefficients of a semi-infinite turbid medium. An obliquely incident light beam causes the center of the far diffuse reflectance to shift from the point of incidence, where the far diffuse reflectance refers to the diffuse reflectance that is several transport mean free paths away from the incident point. The amount of shift yields the diffusion constant by a simple formula, and the slope of the diffuse reflectance yields the attenuation coefficient. Only the relative profile of the diffuse reflectance is needed to deduce both optical parameters, which makes this method attractive in clinical settings because it does not require a stringent calibration for absolute quantity measurements. This method was tested theoretically by Monte Carlo simulations and experimentally by a reflectometer. Because this method can be used to measure optical properties of biological tissues quickly and requires only inexpensive equipment, it has potential clinical application to the diagnosis of disease or monitoring of treatments.

Item Type:Book Section
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URLURL TypeDescription
Wang, Lihong0000-0001-9783-4383
Additional Information:© 1995 Society of Photo-Optical Instrumentation Engineers (SPIE). The project was sponsored in part by The Whitaker Foundation, Air Force Office of Scientific Research grant F49620-93-1-0298DEF, Department of Energy grant DE-FG05-91ER61226, and National Institutes of Health grant R29-HL45045.
Funding AgencyGrant Number
Whitaker FoundationUNSPECIFIED
Air Force Office of Scientific Research (AFOSR)F49620-93-1-0298DEF
Department of Energy (DOE)DE-FG05-91ER61226
Subject Keywords:Oblique incidence, reflectometry, optical properties, turbid media, biological tissues
Series Name:Proceedings of SPIE
Issue or Number:2627
Record Number:CaltechAUTHORS:20181207-161549513
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Official Citation:Lihong V. Wang, Shao-Pow Lin, Steven L. Jacques, Frank K. Tittel, Jennifer Harder, John Jancarik, Beth Michelle Mammini, Ward Small, Luiz Barroca Da Silva, "Oblique-incidence reflectometry: one relative profile measurement of diffuse reflectance yields two optical parameters," Proc. SPIE 2627, Optical Biopsies, (27 December 1995); doi: 10.1117/12.228887
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:91621
Deposited By: George Porter
Deposited On:11 Dec 2018 23:13
Last Modified:16 Nov 2021 03:42

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