Jensen, Carsten P. and Christensen, Finn E. and Chen, Hubert and Smitt, Erik B. W. and Ziegler, Eric (2002) Multilayer coating facility for the HEFT hard x-ray telescope. In: X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions. Proceedings of SPIE. No.4496. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 104-108. ISBN 9780819442109. https://resolver.caltech.edu/CaltechAUTHORS:20181213-143632127
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Abstract
A planar magnetron sputtering facility has been established at the Danish Space Research Institute (DSRI) for the production coating of depth graded multilayers on the thermally slumped glass segments which form the basis for the hard X-ray telescope on the HEFT balloon project. The facility is capable of coating 20-45 mirrors segments in each run. The coatings are optimized W/Si coatings. The paper describes the facility, the results of the calibration and presents data for the X-ray testing of flight mirrors.
| Item Type: | Book Section | ||||||
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| Additional Information: | © 2002 Society of Photo-Optical Instrumentation Engineers (SPIE). | ||||||
| Subject Keywords: | Multilayer, Hard X-ray telescope | ||||||
| Series Name: | Proceedings of SPIE | ||||||
| Issue or Number: | 4496 | ||||||
| Record Number: | CaltechAUTHORS:20181213-143632127 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20181213-143632127 | ||||||
| Official Citation: | Carsten P. Jensen, Finn Erland Christensen, Hubert C.M. Chen, Erik B. W. Smitt, Eric Ziegler, "Multilayer coating facility for the HEFT hard x-ray telescope," Proc. SPIE 4496, X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions, (30 January 2002); doi: 10.1117/12.454368 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 91806 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | George Porter | ||||||
| Deposited On: | 19 Dec 2018 18:21 | ||||||
| Last Modified: | 03 Oct 2019 20:38 |
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