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Curved detectors for wide field imaging systems: impact on tolerance analysis

Muslimov, Eduard and Hugot, Emmanuel and Lombardo, Simona and Roulet, Melanie and Behaghel, Thibault and Ferrari, Marc and Jahn, Wilfried and Gaschet, Christophe and Chambion, Bertrand and Henry, David (2018) Curved detectors for wide field imaging systems: impact on tolerance analysis. In: Optics, Photonics, and Digital Technologies for Imaging Applications V. Proceedings of SPIE. No.10679. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, Art. No. 106790W. ISBN 9781510618848. https://resolver.caltech.edu/CaltechAUTHORS:20190102-155138231

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Abstract

In the present paper we consider quantitative estimation of the tolerances widening in optical systems with curved detectors. The gain in image quality allows to loosen the margins for manufacturing and assembling errors. On another hand, the requirements for the detector shape and positioning become more tight. We demonstrate both of the effects on example of two optical designs. The first one is a rotationally-symmetrical lens with focal length of 25 mm, f-ratio of 3.5 and field of view equal to 72°, working in the visible domain. The second design is a three-mirror anastigmat telescope with focal length of 250 mm, f-ratio of 2.0 and field of view equal to 4°x4°. In both of the cases use of curved detectors allow to increase the image quality and substantially decrease the requirements for manufacturing precision.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1117/12.2305923DOIArticle
ORCID:
AuthorORCID
Hugot, Emmanuel0000-0002-5879-6318
Lombardo, Simona0000-0002-2161-8104
Henry, David0000-0002-5201-0644
Additional Information:© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE). The authors acknowledge the support of the European Research council through the H2020 - ERC-STG-2015 – 678777 ICARUS program. This research was partially supported by the HARMONI instrument consortium. We also would like to thank Pierre Baron from Altechna Company for fruitful discussions, which helped us to state the aim of this study.
Group:GALCIT
Funders:
Funding AgencyGrant Number
European Research Council (ERC)678777
HARMONI instrument consortiumUNSPECIFIED
Series Name:Proceedings of SPIE
Issue or Number:10679
DOI:10.1117/12.2305923
Record Number:CaltechAUTHORS:20190102-155138231
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20190102-155138231
Official Citation:Eduard Muslimov, Emmanuel Hugot, Simona Lombardo, Melanie Roulet, Thibault Behaghel, Marc Ferrari, Wilfried Jahn, Christophe Gaschet, Bertrand Chambion, David Henry, "Curved detectors for wide field imaging systems: impact on tolerance analysis ," Proc. SPIE 10679, Optics, Photonics, and Digital Technologies for Imaging Applications V, 106790W (24 May 2018);doi: 10.1117/12.2305923
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:92004
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:03 Jan 2019 23:35
Last Modified:16 Nov 2021 03:46

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