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Curved CMOS sensor: characterization of the first fully functional prototype

Lombardo, Simona and Behaghel, Thibault and Chambion, Bertrand and Jahn, Wilfried and Hugot, Emmanuel and Muslimov, Eduard and Roulet, Melanie and Ferrari, Marc and Gaschet, Christophe and Henry, David and Caplet, Stéphane (2018) Curved CMOS sensor: characterization of the first fully functional prototype. In: Optics, Photonics, and Digital Technologies for Imaging Applications V. Proceedings of SPIE. No.10679. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, Art. No. 1067910. ISBN 9781510618848. http://resolver.caltech.edu/CaltechAUTHORS:20190102-155138551

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Abstract

Many are the optical designs that generate curved focal planes for which field flattener must be implemented. This generally implies the use of more optical elements and a consequent loss of throughput and performances. With the recent development of curved sensor this can be avoided. This new technology has been gathering more and more attention from a very broad community, as the potential applications are multiple: from low-cost commercial to high impact scientific systems, to mass-market and on board cameras, defense and security, and astronomical community. We describe here the first concave curved CMOS detector developed within a collaboration between CNRS-LAM and CEA-LETI. This fully-functional detector 20Mpix (CMOSIS CMV20000) has been curved down to a radius of R_c =150mm over a size of 24x32mm^2. We present here the methodology adopted for its characterization and describe in detail all the results obtained. We also discuss the main components of noise, such as the readout noise, the fixed pattern noise and the dark current. Finally we provide a comparison with the at version of the same sensor in order to establish the impact of the curving process on the main characteristics of the sensor.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1117/12.2307170DOIArticle
ORCID:
AuthorORCID
Henry, David0000-0002-5201-0644
Additional Information:© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE). The authors acknowledge the support of the European Research council through the H2020 - ERC-STG-2015 678777 ICARUS program. This activity was partially funded by the French Research Agency (ANR) through the LabEx FOCUS ANR-11-LABX-0013.
Group:GALCIT
Funders:
Funding AgencyGrant Number
European Research Council (ERC)678777
Agence Nationale pour la Recherche (ANR)ANR-11-LABX-0013
Subject Keywords:CMOS, curved detector, characterization, noise properties, dark current
Record Number:CaltechAUTHORS:20190102-155138551
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20190102-155138551
Official Citation:Simona Lombardo, Thibault Behaghel, Bertrand Chambion, Wilfried Jahn, Emmanuel Hugot, Eduard Muslimov, Melanie Roulet, Marc Ferrari, Christophe Gaschet, David Henry, Stéphane Caplet, "Curved CMOS sensor: characterization of the first fully functional prototype," Proc. SPIE 10679, Optics, Photonics, and Digital Technologies for Imaging Applications V, 1067910 (31 July 2018); doi: 10.1117/12.2307170
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:92007
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:03 Jan 2019 23:42
Last Modified:03 Jan 2019 23:42

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