Curved CMOS sensor: characterization of the first fully functional prototype

Abstract

Many are the optical designs that generate curved focal planes for which field flattener must be implemented. This generally implies the use of more optical elements and a consequent loss of throughput and performances. With the recent development of curved sensor this can be avoided. This new technology has been gathering more and more attention from a very broad community, as the potential applications are multiple: from low-cost commercial to high impact scientific systems, to mass-market and on board cameras, defense and security, and astronomical community. We describe here the first concave curved CMOS detector developed within a collaboration between CNRS-LAM and CEA-LETI. This fully-functional detector 20Mpix (CMOSIS CMV20000) has been curved down to a radius of R_c =150mm over a size of 24x32mm^2. We present here the methodology adopted for its characterization and describe in detail all the results obtained. We also discuss the main components of noise, such as the readout noise, the fixed pattern noise and the dark current. Finally we provide a comparison with the at version of the same sensor in order to establish the impact of the curving process on the main characteristics of the sensor.