Garcia-Uribe, A. and Hong, J.-M. and Zou, J. and Wang, L. V. (2007) Micromachined Oblique Incidence Refleciometry (OIR) Probe for Skin Cancer Detection. In: TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference. IEEE , Piscataway, NJ, pp. 1099-1102. ISBN 1424408415. https://resolver.caltech.edu/CaltechAUTHORS:20190304-143522496
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Abstract
We present the design, fabrication and in-vivo testing of a new micromachined probe for skin cancer detection based on oblique incidence reflectometry (OIR). The device miniaturization and fabrication precision provided by micromachining ensure reliable and repeatable high performance of the probe. The developed probe has been tested in a pre-clinical condition. An overall sensitivity of 100% and specificity of 93% haven been achieved in the classification of malignant and benign skin lesions.
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| Additional Information: | © 2007 IEEE. The authors thank Dr. Duvic, Dr. Mays, Dr. Hymens and Dr. Mansfield for their help during the data collection at The University of Texas M. D. Anderson Cancer Center (Melanoma and Skin Center). This project is supported by National Institutes of Health under contract R01 CA106728. | ||||||
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| Subject Keywords: | Micromachined probe, diffuse reflectance, spectroscopy, skin cancer | ||||||
| Record Number: | CaltechAUTHORS:20190304-143522496 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20190304-143522496 | ||||||
| Official Citation: | A. Garcia-Uribe, J. -. Hong, J. Zou and L. V. Wang, "Micromachined Oblique Incidence Refleciometry (OIR) Probe for Skin Cancer Detection," TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference, Lyon, 2007, pp. 1099-1102. doi: 10.1109/SENSOR.2007.4300326 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 93457 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | George Porter | ||||||
| Deposited On: | 05 Mar 2019 19:03 | ||||||
| Last Modified: | 09 Mar 2020 13:19 |
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