Georgiades, N. Ph. and Polzik, E. S. and Kimble, H. J. (1996) Frequency metrology via quantum interference in two-photon excitation. In: Proceedings of the 20th Biennial Conference on Precision Electromagnetic Measurements. IEEE , Piscataway, NJ, Art. No. TU4A-5. ISBN 0-7803-3376-4. https://resolver.caltech.edu/CaltechAUTHORS:20190306-133203027
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Abstract
Quantum interference in atomic two-photon excitation is exploited for optical demodulation, with phase-sensitive detection at ±12 THz having been achieved. By utilizing the atoms as ultrafast nonlinear mixing elements, a new technique for the comparison of essentially arbitrary frequencies over the range 200-2000 nm is presented.
| Item Type: | Book Section | ||||||
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| Additional Information: | © 1996 IEEE. This work is supported by the Division of Chemical Sciences, Office of Basic Energy Sciences, Office of Energy Research, U.S. Department of Energy. | ||||||
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| DOI: | 10.1109/CPEM.1996.547394 | ||||||
| Record Number: | CaltechAUTHORS:20190306-133203027 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20190306-133203027 | ||||||
| Official Citation: | N. P. Georgiades, E. S. Polzik and H. J. Kimble, "Frequency metrology via quantum interference in two-photon excitation," Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements, Braunschweig, Germany, 1996, pp. SUPL7-SUPL8. doi: 10.1109/CPEM.1996.547394 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 93601 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Tony Diaz | ||||||
| Deposited On: | 06 Mar 2019 22:48 | ||||||
| Last Modified: | 16 Nov 2021 16:59 |
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