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Frequency metrology via quantum interference in two-photon excitation

Georgiades, N. Ph. and Polzik, E. S. and Kimble, H. J. (1996) Frequency metrology via quantum interference in two-photon excitation. In: Proceedings of the 20th Biennial Conference on Precision Electromagnetic Measurements. IEEE , Piscataway, NJ, Art. No. TU4A-5. ISBN 0-7803-3376-4. http://resolver.caltech.edu/CaltechAUTHORS:20190306-133203027

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Abstract

Quantum interference in atomic two-photon excitation is exploited for optical demodulation, with phase-sensitive detection at ±12 THz having been achieved. By utilizing the atoms as ultrafast nonlinear mixing elements, a new technique for the comparison of essentially arbitrary frequencies over the range 200-2000 nm is presented.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/CPEM.1996.547394DOIArticle
ORCID:
AuthorORCID
Polzik, E. S.0000-0001-9859-6591
Additional Information:© 1996 IEEE. This work is supported by the Division of Chemical Sciences, Office of Basic Energy Sciences, Office of Energy Research, U.S. Department of Energy.
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)UNSPECIFIED
Record Number:CaltechAUTHORS:20190306-133203027
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20190306-133203027
Official Citation:N. P. Georgiades, E. S. Polzik and H. J. Kimble, "Frequency metrology via quantum interference in two-photon excitation," Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements, Braunschweig, Germany, 1996, pp. SUPL7-SUPL8. doi: 10.1109/CPEM.1996.547394
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:93601
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:06 Mar 2019 22:48
Last Modified:06 Mar 2019 22:48

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